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Integrated Circuits (ICs)

SN74LV10ANSR

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Texas Instruments

3-CH, 3-INPUT, 2-V TO 5.5-V NAND GATES

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Product Image
Integrated Circuits (ICs)

SN74LV10ANSR

Active
Texas Instruments

3-CH, 3-INPUT, 2-V TO 5.5-V NAND GATES

Technical Specifications

Parameters and characteristics for this part

SpecificationSN74LV10ANSR
Current - Output High, Low [custom]12 mA
Current - Output High, Low [custom]12 mA
Current - Quiescent (Max) [Max]20 µA
Input Logic Level - High1.5 V
Input Logic Level - Low0.5 V
Logic TypeNAND Gate
Max Propagation Delay @ V, Max CL7.9 ns
Mounting TypeSurface Mount
Number of Circuits3
Number of Inputs3
Operating Temperature [Max]85 °C
Operating Temperature [Min]-40 °C
Package / Case14-SOIC
Package / Case [x]0.209 "
Package / Case [y]5.3 mm
Supplier Device Package14-SO
Voltage - Supply [Max]5.5 V
Voltage - Supply [Min]2 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyCut Tape (CT) 1$ 0.60
10$ 0.51
25$ 0.48
100$ 0.38
250$ 0.35
500$ 0.30
1000$ 0.23
Digi-Reel® 1$ 0.60
10$ 0.51
25$ 0.48
100$ 0.38
250$ 0.35
500$ 0.30
1000$ 0.23
Tape & Reel (TR) 2000$ 0.13
LCSCPiece 1$ 0.48
200$ 0.19
500$ 0.18
1000$ 0.18
Texas InstrumentsLARGE T&R 1$ 0.42
100$ 0.29
250$ 0.22
1000$ 0.15

Description

General part information

SN74LV10A Series

These triple 3-input positive-NAND gates are designed for 2 V to 5.5 V VCCoperation. The SN74LV10A devices perform the Boolean function Y =A • B • Cin positive logic. These devices are fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down.

These triple 3-input positive-NAND gates are designed for 2 V to 5.5 V VCCoperation. The SN74LV10A devices perform the Boolean function Y =A • B • Cin positive logic. These devices are fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down.