Texas Instruments

The ADC12DC105 is a high-performance CMOS analog-to-digital converter capable of converting two analog input signals into 12-bit digital words at rates up to 105 Mega Samples Per Second (MSPS). These converters use a differential, pipelined architecture with digital error correction and an on-chip sample-and-hold circuit to minimize power consumption and the external component count, while providing excellent dynamic performance. A unique sample-and-hold stage yields a full-power bandwidth of 1 GHz. The ADC12DC080/105 may be operated from a single +3.0V or +3.3V power supply. A power-down feature reduces the power consumption to very low levels while still allowing fast wake-up time to full operation. The differential inputs provide a 2V full scale differential input swing. A stable 1.2V internal voltage reference is provided, or the ADC12DC105 can be operated with an external 1.2V reference. Output data format (offset binary versus 2's complement) and duty cycle stabilizer are pin-selectable. The duty cycle stabilizer maintains performance over a wide range of clock duty cycles. The ADC12DC105 is available in a 60-lead WQFN package and operates over the industrial temperature range of −40°C to +85°C. The ADC12DC105 is a high-performance CMOS analog-to-digital converter capable of converting two analog input signals into 12-bit digital words at rates up to 105 Mega Samples Per Second (MSPS). These converters use a differential, pipelined architecture with digital error correction and an on-chip sample-and-hold circuit to minimize power consumption and the external component count, while providing excellent dynamic performance. A unique sample-and-hold stage yields a full-power bandwidth of 1 GHz. The ADC12DC080/105 may be operated from a single +3.0V or +3.3V power supply. A power-down feature reduces the power consumption to very low levels while still allowing fast wake-up time to full operation. The differential inputs provide a 2V full scale differential input swing. A stable 1.2V internal voltage reference is provided, or the ADC12DC105 can be operated with an external 1.2V reference. Output data format (offset binary versus 2's complement) and duty cycle stabilizer are pin-selectable. The duty cycle stabilizer maintains performance over a wide range of clock duty cycles. The ADC12DC105 is available in a 60-lead WQFN package and operates over the industrial temperature range of −40°C to +85°C.

ADC12xJ1600-Q1 is a family of quad, dual and single channel, 12-bit, 1.6GSPS analog-to-digital converters (ADC). Low power consumption, high sampling rate and 12-bit resolution makes the ADC12xJ1600-Q1 suited for light detection and ranging (LiDAR) systems. ADC12xJ1600-Q1 is qualified for automotive applications. Full-power input bandwidth (-3dB) of 6GHz provides flat frequency response for frequency modulated continuous wave (FMCW) LiDAR systems and provides a narrow impulse response for pulse-based systems. The full-power input bandwidth also enables direct RF sampling of of L-band and S-band. A number of clocking features are included to relax system hardware requirements, such as an internal phase-locked loop (PLL) with integrated voltage-controlled oscillator (VCO) to generate the sampling clock. Four clock outputs are provided to clock the logic and SerDes of the FPGA or ASIC. A timestamp input and output is provided for pulsed systems. JESD204C serialized interface decreases system size by reducing the amount of printed circuit board (PCB) routing. Interface modes support from 2 to 8 lanes (dual and quad channel devices) or 1 to 4 lanes (for the single channel device), with SerDes baud-rates up to 17.16Gbps, to allow the optimal configuration for each application. ADC12xJ1600-Q1 is a family of quad, dual and single channel, 12-bit, 1.6GSPS analog-to-digital converters (ADC). Low power consumption, high sampling rate and 12-bit resolution makes the ADC12xJ1600-Q1 suited for light detection and ranging (LiDAR) systems. ADC12xJ1600-Q1 is qualified for automotive applications. Full-power input bandwidth (-3dB) of 6GHz provides flat frequency response for frequency modulated continuous wave (FMCW) LiDAR systems and provides a narrow impulse response for pulse-based systems. The full-power input bandwidth also enables direct RF sampling of of L-band and S-band. A number of clocking features are included to relax system hardware requirements, such as an internal phase-locked loop (PLL) with integrated voltage-controlled oscillator (VCO) to generate the sampling clock. Four clock outputs are provided to clock the logic and SerDes of the FPGA or ASIC. A timestamp input and output is provided for pulsed systems. JESD204C serialized interface decreases system size by reducing the amount of printed circuit board (PCB) routing. Interface modes support from 2 to 8 lanes (dual and quad channel devices) or 1 to 4 lanes (for the single channel device), with SerDes baud-rates up to 17.16Gbps, to allow the optimal configuration for each application.

The ADC12DJ2700 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ2700 can sample up to 2700 MSPS and up to 5400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ2700 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). The ADC12DJ2700 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ2700 can sample up to 2700 MSPS and up to 5400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ2700 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only). The ADC12DJ3200 device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. In dual-channel mode, the ADC12DJ3200 can sample up to 3200 MSPS and up to 6400 MSPS in single-channel mode. Programmable tradeoffs in channel count (dual-channel mode) and Nyquist bandwidth (single-channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full-power input bandwidth (–3 dB) of 8.0 GHz, with usable frequencies exceeding the –3-dB point in both dual- and single-channel modes, allows direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ3200 uses a high-speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual-channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

The ADC12DJ4000RF device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. ADC12DJ4000RF can be configured as a dual-channel, 4 GSPS ADC or single-channel, 8 GSPS ADC. Support of a useable input frequency range of up to 10GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ4000RF uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multi-channel applications. Optional digital down converters (DDCs) are available to provide digital conversion to baseband and to reduce the interface rate. A programmable FIR filter allows on-chip equalization. The ADC12DJ4000RF device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10 GHz. ADC12DJ4000RF can be configured as a dual-channel, 4 GSPS ADC or single-channel, 8 GSPS ADC. Support of a useable input frequency range of up to 10GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ4000RF uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multi-channel applications. Optional digital down converters (DDCs) are available to provide digital conversion to baseband and to reduce the interface rate. A programmable FIR filter allows on-chip equalization.

The ADC12DJ5200-EP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10GHz. ADC12DJ5200-EP can be configured as a dual-channel, 5.2GSPS ADC or single-channel, 10.4GSPS ADC. Support of a useable input frequency range of up to 10GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ5200-EP uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multichannel applications. Optional digital down converters (DDCs) are available to provide digital conversion to base-band and to reduce the interface rate. A programmable FIR filter allows on-chip equalization. The ADC12DJ5200-EP device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10GHz. ADC12DJ5200-EP can be configured as a dual-channel, 5.2GSPS ADC or single-channel, 10.4GSPS ADC. Support of a useable input frequency range of up to 10GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ5200-EP uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multichannel applications. Optional digital down converters (DDCs) are available to provide digital conversion to base-band and to reduce the interface rate. A programmable FIR filter allows on-chip equalization.

The ADC12DJ5200RF device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10GHz. ADC12DJ5200RF can be configured as a dual-channel, 5.2GSPS ADC or single-channel, 10.4GSPS ADC. Support of a useable input frequency range of up to 10GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ5200RF uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multi-channel applications. Optional digital down converters (DDCs) are available to provide digital conversion to baseband and to reduce the interface rate. A programmable FIR filter allows on-chip equalization. The ADC12DJ5200RF device is an RF-sampling, giga-sample, analog-to-digital converter (ADC) that can directly sample input frequencies from DC to above 10GHz. ADC12DJ5200RF can be configured as a dual-channel, 5.2GSPS ADC or single-channel, 10.4GSPS ADC. Support of a useable input frequency range of up to 10GHz enables direct RF sampling of L-band, S-band, C-band, and X-band for frequency agile systems. The ADC12DJ5200RF uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multi-channel applications. Optional digital down converters (DDCs) are available to provide digital conversion to baseband and to reduce the interface rate. A programmable FIR filter allows on-chip equalization.

The ADC12DJ5200SE is an RF-sampling, giga-sample, analog-to-digital converter (ADC) with integrated input baluns. The ADC12DJ5200SE can be configured as a dual-channel, 5.2 GSPS ADC or single-channel, 10.4 GSPS ADC. The -3dB input frequency range of 2 to 6.3GHz enables direct RF sampling of S-band and C-band for frequency agile systems. The ADC12DJ5200SE uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multi-channel applications. Optional digital down converters (DDCs) are available to provide digital conversion to baseband and to reduce the interface rate. A programmable FIR filter allows on-chip equalization. The ADC12DJ5200SE is an RF-sampling, giga-sample, analog-to-digital converter (ADC) with integrated input baluns. The ADC12DJ5200SE can be configured as a dual-channel, 5.2 GSPS ADC or single-channel, 10.4 GSPS ADC. The -3dB input frequency range of 2 to 6.3GHz enables direct RF sampling of S-band and C-band for frequency agile systems. The ADC12DJ5200SE uses a high-speed JESD204C output interface with up to 16 serialized lanes supporting up to 17.16Gbps line rate. Deterministic latency and multi-device synchronization is supported through JESD204C subclass-1. The JESD204C interface can be configured to trade-off line rate and number of lanes. Both 8b/10b and 64b/66b data encoding schemes are supported. 64b/66b encoding supports forward error correction (FEC) for improved bit error rates. The interface is backwards compatible with JESD204B receivers. Innovative synchronization features, including noiseless aperture delay adjustment and SYSREF windowing, simplify system design for multi-channel applications. Optional digital down converters (DDCs) are available to provide digital conversion to baseband and to reduce the interface rate. A programmable FIR filter allows on-chip equalization.

ADC12xJ800 is a family of quad, dual and single channel, 12-bit, 800 MSPS analog-to-digital converters (ADC). Low power consumption, high sampling rate and 12-bit resolution makes the ADC12xJ800 ideally suited for a variety of multi-channel communications and test systems. Full-power input bandwidth (-3dB) of 6GHz enables direct RF sampling of L-band and S-band. A number of clocking features are included to relax system hardware requirements, such as an internal phase-locked loop (PLL) with integrated voltage-controlled oscillator (VCO) to generate the sampling clock. Four clock outputs are provided to clock the logic and SerDes of the FPGA or ASIC. A timestamp input and output is provided for pulsed systems. JESD204C serialized interface decreases system size by reducing the amount of printed circuit board (PCB) routing. Interface modes support from 2 to 8 lanes (dual and quad channel devices) or 1 to 4 lanes (for the single channel device), with SerDes baud-rates up to 17.16Gbps, to allow the optimal configuration for each application. ADC12xJ800 is a family of quad, dual and single channel, 12-bit, 800 MSPS analog-to-digital converters (ADC). Low power consumption, high sampling rate and 12-bit resolution makes the ADC12xJ800 ideally suited for a variety of multi-channel communications and test systems. Full-power input bandwidth (-3dB) of 6GHz enables direct RF sampling of L-band and S-band. A number of clocking features are included to relax system hardware requirements, such as an internal phase-locked loop (PLL) with integrated voltage-controlled oscillator (VCO) to generate the sampling clock. Four clock outputs are provided to clock the logic and SerDes of the FPGA or ASIC. A timestamp input and output is provided for pulsed systems. JESD204C serialized interface decreases system size by reducing the amount of printed circuit board (PCB) routing. Interface modes support from 2 to 8 lanes (dual and quad channel devices) or 1 to 4 lanes (for the single channel device), with SerDes baud-rates up to 17.16Gbps, to allow the optimal configuration for each application.