SN74AHC32Q-Q1 Series

Enhanced product, 4-ch, 2-input 2-V to 5.5-V high-speed (9 ns) OR gate

Catalog

Enhanced product, 4-ch, 2-input 2-V to 5.5-V high-speed (9 ns) OR gate

Part	Mounting Type	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Input Logic Level - Low [Min]	Input Logic Level - Low [Max]	Voltage - Supply [Max]	Voltage - Supply [Min]	Number of Inputs	Logic Type	Operating Temperature [Max]	Operating Temperature [Min]	Number of Circuits	Max Propagation Delay @ V, Max CL	Input Logic Level - High [Max]	Input Logic Level - High [Min]	Package / Case	Package / Case [x]	Package / Case [custom]	Package / Case [custom]	Supplier Device Package	Package / Case [y]	Grade	Qualification
Texas Instruments SN74AHC32DGVR	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-TFSOP	0.173 in 4.4 mm
Texas Instruments SN74AHC32PWR	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-TSSOP		0.173 "	4.4 mm	14-TSSOP
Texas Instruments SN74AHC32NSR	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-SOIC	0.209 "			14-SO	5.3 mm
Texas Instruments SN74AHC32N	Through Hole	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-DIP	0.3 "				7.62 mm
Texas Instruments SN74AHC32RGYR	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-VFQFN Exposed Pad				14-VQFN (3.5x3.5)
Texas Instruments SN74AHC32DR	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-SOIC	0.154 in				3.9 mm
Texas Instruments SN74AHC32QDRQ1	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-SOIC	0.154 in				3.9 mm	Automotive	AEC-Q100
Texas Instruments SN74AHC32D	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-SOIC	0.154 in				3.9 mm
Texas Instruments SN74AHC32QPWRG4Q1	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-TSSOP		0.173 "	4.4 mm	14-TSSOP		Automotive	AEC-Q100
Texas Instruments SN74AHC32QDRG4Q1	Surface Mount	8 mA	8 mA	0.5 V	1.65 V	5.5 V	2 V	2	OR Gate	125 °C	-40 °C	4	7.5 ns	3.85 V	1.5 V	14-SOIC	0.154 in				3.9 mm	Automotive	AEC-Q100

Catalog

Enhanced product, 4-ch, 2-input 2-V to 5.5-V high-speed (9 ns) OR gate

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessOperating Range 2-V to 5.5-V VCCLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessOperating Range 2-V to 5.5-V VCCLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.

Description

The SN74AHC32Q-Q1 devices are quadruple 2-input positive-OR gates. These devices perform the Boolean function Y = A × B or Y = A + B in positive logic. The SN74AHC32Q-Q1 devices are quadruple 2-input positive-OR gates. These devices perform the Boolean function Y = A × B or Y = A + B in positive logic.