SN74HC253-Q1 Series

Automotive Catalog Dual 4-Line To 1-Line Data Selectors/Multiplexers With 3-State Outputs

Catalog

Automotive Catalog Dual 4-Line To 1-Line Data Selectors/Multiplexers With 3-State Outputs

Part	Operating Temperature [Max]	Operating Temperature [Min]	Supplier Device Package	Type	Package / Case	Package / Case [custom]	Package / Case [custom]	Circuit [custom]	Circuit [custom]	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Voltage - Supply [Min]	Voltage - Supply [Max]	Independent Circuits	Voltage Supply Source	Mounting Type	Package / Case [x]	Package / Case [y]	Package / Case	Package / Case	Qualification	Grade
Texas Instruments SN74HC253DBR	85 °C	-40 °C	16-SSOP	Multiplexer	16-SSOP	0.209 in	5.3 mm	2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Surface Mount
Texas Instruments SN74HC253QDREP	125 °C	-40 °C	16-SOIC	Multiplexer	16-SOIC			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Surface Mount	0.154 in	3.9 mm
Texas Instruments SN74HC253D	85 °C	-40 °C	16-SOIC	Multiplexer	16-SOIC			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Surface Mount	0.154 in	3.9 mm
Texas Instruments SN74HC253N	85 °C	-40 °C	16-PDIP	Multiplexer	16-DIP			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Through Hole			0.3 in	7.62 mm
Texas Instruments SN74HC253DR	85 °C	-40 °C	16-SOIC	Multiplexer	16-SOIC			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Surface Mount	0.154 in	3.9 mm
Texas Instruments CD74HC253MT	125 °C	-55 °C	16-SOIC	Multiplexer	16-SOIC			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Surface Mount	0.154 in	3.9 mm
Texas Instruments SN74HC253QDRG4Q1	125 °C	-40 °C	16-SOIC	Multiplexer	16-SOIC			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Surface Mount	0.154 in	3.9 mm			AEC-Q100	Automotive
Texas Instruments SN74HC253ANSR	85 °C	-40 °C	16-SO	Multiplexer	16-SOIC			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Surface Mount			0.209 "	5.3 mm
Texas Instruments CD74HC253E	125 °C	-55 °C	16-PDIP	Multiplexer	16-DIP			2	4:1	7.8 mA	7.8 mA	2 V	6 V	1	Single Supply	Through Hole			0.3 in	7.62 mm

Catalog

Automotive Catalog Dual 4-Line To 1-Line Data Selectors/Multiplexers With 3-State Outputs

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree3-State Version of ’HC153Wide Operating Voltage Range of 2 V to 6 VHigh-Current Inverting Outputs Drive Up To 15 LSTTL LoadsLow Power Consumption, 80-µA Max ICCTypical tpd= 9 ns±6-mA Output Drive at 5 VLow Input Current of 1 µA MaxPermit Multiplexing From n Lines to One LinePerform Parallel-to-Serial ConversionComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree3-State Version of ’HC153Wide Operating Voltage Range of 2 V to 6 VHigh-Current Inverting Outputs Drive Up To 15 LSTTL LoadsLow Power Consumption, 80-µA Max ICCTypical tpd= 9 ns±6-mA Output Drive at 5 VLow Input Current of 1 µA MaxPermit Multiplexing From n Lines to One LinePerform Parallel-to-Serial ConversionComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

Each data selector/multiplexer contains inverters and drivers to supply full binary decoding data selection to the AND-OR gates. Separate output-control inputs are provided for each of the two 4-line sections. The 3-state outputs can interface with and drive data lines of bus-organized systems. With all but one of the common outputs disabled (in the high-impedance state), the low impedance of the single enabled output drives the bus line to a high or low logic level. Each output has its own output-enable (OE)\ input. The outputs are disabled when their respective OE\ is high. Each data selector/multiplexer contains inverters and drivers to supply full binary decoding data selection to the AND-OR gates. Separate output-control inputs are provided for each of the two 4-line sections. The 3-state outputs can interface with and drive data lines of bus-organized systems. With all but one of the common outputs disabled (in the high-impedance state), the low impedance of the single enabled output drives the bus line to a high or low logic level. Each output has its own output-enable (OE)\ input. The outputs are disabled when their respective OE\ is high.