Integrated Circuits (ICs)

SN74ABT8646DLR

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SCAN TEST DEVICE -40°C TO 85°C 28-PIN SSOP T/R

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Integrated Circuits (ICs)

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SCAN TEST DEVICE -40°C TO 85°C 28-PIN SSOP T/R

Technical Specifications

Parameters and characteristics for this part

Specification	SN74ABT8646DLR

Logic Type	Scan Test Device with Bus Transceiver and Registers
Mounting Type	Surface Mount
Number of Bits	8
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 C
Package / Case	28-BSSOP (0.295", 7.50mm Width)
Supplier Device Package	28-BSSOP
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Operating Temperature [Max]	Operating Temperature [Min]	Number of Bits	Supplier Device Package	Supply Voltage [Max]	Supply Voltage [Min]	Package / Case	Mounting Type	Logic Type	Package / Case [custom]	Package / Case [custom]
Texas Instruments SN74ABT8646DL	85 °C	-40 C	8	28-BSSOP	5.5 V	4.5 V	28-BSSOP (0.295" 7.50mm Width)	Surface Mount	Scan Test Device with Bus Transceiver and Registers
Texas Instruments SN74ABT8646DWRG4	85 °C	-40 C	8	28-SOIC	5.5 V	4.5 V	28-SOIC	Surface Mount	Scan Test Device with Bus Transceiver and Registers	0.295 "	7.5 mm
Texas Instruments SN74ABT8646DLR	85 °C	-40 C	8	28-BSSOP	5.5 V	4.5 V	28-BSSOP (0.295" 7.50mm Width)	Surface Mount	Scan Test Device with Bus Transceiver and Registers
Texas Instruments SN74ABT8646DWR	85 °C	-40 C	8	28-SOIC	5.5 V	4.5 V	28-SOIC	Surface Mount	Scan Test Device with Bus Transceiver and Registers	0.295 "	7.5 mm

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General part information

Scan Test Device with Bus Transceiver and Registers IC 28-BSSOP

Technical documentation and resources

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