74ABT8646 Series
Manufacturer: Texas Instruments
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IC SCAN-TEST-DEV/XCVR 28-SSOP
| Part | Operating Temperature [Max] | Operating Temperature [Min] | Number of Bits | Supplier Device Package | Supply Voltage [Max] | Supply Voltage [Min] | Package / Case | Mounting Type | Logic Type | Package / Case [custom] | Package / Case [custom] |
|---|---|---|---|---|---|---|---|---|---|---|---|
 Texas Instruments | 85 °C | -40 C | 8 | 28-BSSOP | 5.5 V | 4.5 V | 28-BSSOP (0.295" 7.50mm Width) | Surface Mount | Scan Test Device with Bus Transceiver and Registers | ||
 Texas Instruments | 85 °C | -40 C | 8 | 28-SOIC | 5.5 V | 4.5 V | 28-SOIC | Surface Mount | Scan Test Device with Bus Transceiver and Registers | 0.295 " | 7.5 mm |
Texas Instruments | 85 °C | -40 C | 8 | 28-BSSOP | 5.5 V | 4.5 V | 28-BSSOP (0.295" 7.50mm Width) | Surface Mount | Scan Test Device with Bus Transceiver and Registers | ||
Texas Instruments | 85 °C | -40 C | 8 | 28-SOIC | 5.5 V | 4.5 V | 28-SOIC | Surface Mount | Scan Test Device with Bus Transceiver and Registers | 0.295 " | 7.5 mm |