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PCM2705DBG4
Integrated Circuits (ICs)

SN74ABT8646DL

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Texas Instruments

IC SCAN-TEST-DEV/XCVR 28-SSOP

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PCM2705DBG4
Integrated Circuits (ICs)

SN74ABT8646DL

Active
Texas Instruments

IC SCAN-TEST-DEV/XCVR 28-SSOP

Deep-Dive with AI

Technical Specifications

Parameters and characteristics for this part

SpecificationSN74ABT8646DL
Logic TypeScan Test Device with Bus Transceiver and Registers
Mounting TypeSurface Mount
Number of Bits8
Operating Temperature [Max]85 °C
Operating Temperature [Min]-40 C
Package / Case28-BSSOP (0.295", 7.50mm Width)
Supplier Device Package28-BSSOP
Supply Voltage [Max]5.5 V
Supply Voltage [Min]4.5 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyN/A 0$ 0.00
5645$ 0.00
Tube 1$ 9.43
10$ 8.67
40$ 8.31
120$ 7.91

Description

General part information

74ABT8646 Series

Scan Test Device with Bus Transceiver and Registers IC 28-BSSOP

Documents

Technical documentation and resources

No documents available