Zenode.ai Logo
Beta
TO-220-3
Discrete Semiconductor Products

FCP104N60

NRND
ON Semiconductor

POWER MOSFET, N-CHANNEL, SUPERFET<SUP>® </SUP>II, FAST, 600 V, 37 A, 104 MΩ, TO-220

Deep-Dive with AI

Search across all available documentation for this part.

TO-220-3
Discrete Semiconductor Products

FCP104N60

NRND
ON Semiconductor

POWER MOSFET, N-CHANNEL, SUPERFET<SUP>® </SUP>II, FAST, 600 V, 37 A, 104 MΩ, TO-220

Technical Specifications

Parameters and characteristics for this part

SpecificationFCP104N60
Current - Continuous Drain (Id) @ 25°C37 A
Drain to Source Voltage (Vdss)600 V
Drive Voltage (Max Rds On, Min Rds On)10 V
FET TypeN-Channel
Gate Charge (Qg) (Max) @ Vgs [Max]82 nC
Input Capacitance (Ciss) (Max) @ Vds4165 pF
Mounting TypeThrough Hole
Operating Temperature [Max]150 °C
Operating Temperature [Min]-55 °C
Package / CaseTO-220-3
Power Dissipation (Max)357 W
Rds On (Max) @ Id, Vgs [Max]104 mOhm
Supplier Device PackageTO-220-3
TechnologyMOSFET (Metal Oxide)
Vgs (Max)20 V
Vgs(th) (Max) @ Id3.5 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyBulk 93$ 3.23
93$ 3.23
Tube 1$ 4.86
1$ 4.86
10$ 3.28
10$ 3.28
100$ 2.80
100$ 2.80
NewarkEach 1$ 6.05
10$ 5.25
25$ 5.02
50$ 4.86
100$ 4.68
250$ 4.57
ON SemiconductorN/A 1$ 2.58

Description

General part information

FCP104N60F Series

SuperFET®II MOSFET is a brand-new high voltage super-junction (SJ) MOSFET family that is utilizing charge balance technology for outstanding low on-resistance and lower gate charge performance. This technology is tailored to minimize conduction loss, provide superior switching performance, dv/dt rate and higher avalanche energy.Consequently, SuperFET II MOSFET is very suitable for the switching power applications such as PFC, server/telecom power, FPD TV power, ATX power and industrial power applications. SuperFET®II FRFET®MOSFET’s optimized body diode reverse recovery performance can remove additional component and improve system reliability.