SN74LV08A-EP Series

4-ch, 2-input 2-V to 5.5-V high-speed (7 ns) AND gate

Catalog

4-ch, 2-input 2-V to 5.5-V high-speed (7 ns) AND gate

Part	Operating Temperature [Max]	Operating Temperature [Min]	Supplier Device Package	Max Propagation Delay @ V, Max CL	Mounting Type	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Logic Type	Voltage - Supply [Max]	Voltage - Supply [Min]	Input Logic Level - High	Number of Inputs	Current - Quiescent (Max) [Max]	Number of Circuits	Package / Case [custom]	Package / Case [custom]	Package / Case	Input Logic Level - Low	Package / Case [x]	Package / Case [y]	Qualification	Grade
Texas Instruments SN74LV08APW	125 °C	-40 °C	14-TSSOP	7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4	0.173 "	4.4 mm	14-TSSOP	0.5 V
Texas Instruments SN74LV08ARGYRG4	125 °C	-40 °C	14-VQFN (3.5x3.5)	7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4			14-VFQFN Exposed Pad	0.5 V
Texas Instruments SN74LV08ARGYR	125 °C	-40 °C	14-VQFN (3.5x3.5)	7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4			14-VFQFN Exposed Pad	0.5 V
Texas Instruments SN74LV08AD	125 °C	-40 °C		7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4			14-SOIC	0.5 V	0.154 in	3.9 mm
Texas Instruments SN74LV08ADR	125 °C	-40 °C		7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4			14-SOIC	0.5 V	0.154 in	3.9 mm
Texas Instruments SN74LV08APWT	125 °C	-40 °C	14-TSSOP	7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4	0.173 "	4.4 mm	14-TSSOP	0.5 V
Texas Instruments SN74LV08ADRE4	125 °C	-40 °C		7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4			14-SOIC	0.5 V	0.154 in	3.9 mm
Texas Instruments SN74LV08ATPWRQ1	105 ░C	-40 °C	14-TSSOP	7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4	0.173 "	4.4 mm	14-TSSOP	0.5 V			AEC-Q100	Automotive
Texas Instruments SN74LV08AMPWREP	125 °C	-55 °C	14-TSSOP	7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4	0.173 "	4.4 mm	14-TSSOP	0.5 V
Texas Instruments SN74LV08APWTG4	125 °C	-40 °C	14-TSSOP	7.9 ns	Surface Mount	12 mA	12 mA	AND Gate	5.5 V	2 V	1.5 V	2	20 µA	4	0.173 "	4.4 mm	14-TSSOP	0.5 V

Catalog

4-ch, 2-input 2-V to 5.5-V high-speed (7 ns) AND gate

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Typical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2.3 V at VCC= 3.3 V, TA= 25°CSupports Mixed-Mode Voltage Operation on All PortsIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Typical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2.3 V at VCC= 3.3 V, TA= 25°CSupports Mixed-Mode Voltage Operation on All PortsIoffSupports Partial-Power-Down Mode OperationLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)1000-V Charged-Device Model (C101)(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

This quadruple 2-input positive-AND gate is designed for 2-V to 5.5-V VCCoperation. The SN74LV08A-EP performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. This quadruple 2-input positive-AND gate is designed for 2-V to 5.5-V VCCoperation. The SN74LV08A-EP performs the Boolean function Y = A • B or Y = (A\ + B\)\ in positive logic. This device is fully specified for partial-power-down applications using Ioff. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.