SN74LVC00A-EP Series

Automotive four-channel, two-input, 1.1V to 3.6V NAND gates

Catalog

Automotive four-channel, two-input, 1.1V to 3.6V NAND gates

Part	Number of Inputs	Current - Quiescent (Max) [Max]	Number of Circuits	Logic Type	Input Logic Level - High [Min]	Input Logic Level - High [Max]	Operating Temperature [Max]	Operating Temperature [Min]	Max Propagation Delay @ V, Max CL	Supplier Device Package	Input Logic Level - Low [Max]	Input Logic Level - Low [Min]	Current - Output High, Low	Package / Case	Package / Case	Package / Case	Voltage - Supply [Min]	Voltage - Supply [Max]	Mounting Type	Package / Case [custom]	Package / Case [custom]	Package / Case [x]	Package / Case [y]	Input Logic Level - Low	Qualification	Grade
Texas Instruments SN74LVC00ADBRG4	2	1 çA	4	NAND Gate	1.7 V	2 V	125 °C	-40 °C	4.1 ns	14-SSOP	0.8 V	0.7 V	24 mA	5.3 mm	14-SSOP	0.209 "	1.65 V	3.6 V	Surface Mount
Texas Instruments SN74LVC00ADB
Texas Instruments SN74LVC00APWG4	2	1 çA	4	NAND Gate	1.7 V	2 V	125 °C	-40 °C	4.1 ns	14-TSSOP	0.8 V	0.7 V	24 mA		14-TSSOP		1.65 V	3.6 V	Surface Mount	0.173 "	4.4 mm
Texas Instruments SN74LVC00APWR	2	1 çA	4	NAND Gate	1.7 V	2 V	125 °C	-40 °C	4.1 ns	14-TSSOP	0.8 V	0.7 V	24 mA		14-TSSOP		1.65 V	3.6 V	Surface Mount	0.173 "	4.4 mm
Texas Instruments SN74LVC00AD	2	1 çA	4	NAND Gate	1.7 V	2 V	125 °C	-40 °C	4.1 ns		0.8 V	0.7 V	24 mA		14-SOIC		1.65 V	3.6 V	Surface Mount			0.154 in	3.9 mm
Texas Instruments SN74LVC00AMPWREP	2	10 µA	4	NAND Gate			125 °C	-55 °C	4.3 ns	14-TSSOP			24 mA		14-TSSOP		2 V	3.6 V	Surface Mount	0.173 "	4.4 mm			0.8 V
Texas Instruments SN74LVC00AWBQARQ1	2	10 µA	4	NAND Gate			125 °C	-40 °C	4.3 ns	14-WQFN (3x2.5)			24 mA		14-WFDFN Exposed Pad		2 V	3.6 V	Surface Mount Wettable Flank					0.8 V	AEC-Q100	Automotive
Texas Instruments SN74LVC00ANS
Texas Instruments SN74LVC00ADRE4	2	1 çA	4	NAND Gate	1.7 V	2 V	125 °C	-40 °C	4.1 ns		0.8 V	0.7 V	24 mA		14-SOIC		1.65 V	3.6 V	Surface Mount			0.154 in	3.9 mm
Texas Instruments SN74LVC00ADRG4	2	1 çA	4	NAND Gate	1.7 V	2 V	125 °C	-40 °C	4.1 ns		0.8 V	0.7 V	24 mA		14-SOIC		1.65 V	3.6 V	Surface Mount			0.154 in	3.9 mm

Catalog

Automotive four-channel, two-input, 1.1V to 3.6V NAND gates

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -40°C to 125°C and -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 4.3 ns at 3.3 VTypical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°C(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -40°C to 125°C and -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 4.3 ns at 3.3 VTypical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°C(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

The SN54LVC00A quadruple 2-input positive-NAND gate is designed for 2.7V to 3.6V VCC operation, and the SN74LVC00A quadruple 2-input positive-NAND gate is designed for 1.65V to 3.6V VCC operation. The SNx4LVC00A devices perform the Boolean function Y = A • B or Y = A + B in positive logic. Inputs can be driven from either 3.3V or 5V devices. This feature allows the use of these devices as translators in a mixed 3.3V/5V system environment. The SN54LVC00A quadruple 2-input positive-NAND gate is designed for 2.7V to 3.6V VCC operation, and the SN74LVC00A quadruple 2-input positive-NAND gate is designed for 1.65V to 3.6V VCC operation. The SNx4LVC00A devices perform the Boolean function Y = A • B or Y = A + B in positive logic. Inputs can be driven from either 3.3V or 5V devices. This feature allows the use of these devices as translators in a mixed 3.3V/5V system environment.