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SN74LVTH244A-EP

SN74LVTH244A-EP Series

Enhanced product 8-ch, 2.7-V to 3.6-V buffers with bus-hold, TTL-compatible CMOS inputs and 3-state

Manufacturer: Texas Instruments

Catalog

Enhanced product 8-ch, 2.7-V to 3.6-V buffers with bus-hold, TTL-compatible CMOS inputs and 3-state

Key Features

Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeSupports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)Typical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CSupports Unregulated Battery Operation Down to 2.7 VIoffand Power-Up 3-State Support Hot InsertionBus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown ResistorsLatch-Up Performance Exceeds 500 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeSupports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC)Typical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CSupports Unregulated Battery Operation Down to 2.7 VIoffand Power-Up 3-State Support Hot InsertionBus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown ResistorsLatch-Up Performance Exceeds 500 mA Per JESD 17ESD Protection Exceeds JESD 222000-V Human-Body Model (A114-A)200-V Machine Model (A115-A)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

AI
These octal buffers and line drivers are designed specifically for low-voltage (3.3-V) VCCoperation, but with the capability to provide a TTL interface to a 5-V system environment. The ’LVTH244A devices are organized as two 4-bit line drivers with separate output-enable (OE)\ inputs. When OE\ is low, the devices pass data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state. To ensure the high-impedance state during power up or power down, OE\ should be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended. These devices are fully specified for hot-insertion applications using Ioffand power-up 3-state. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down, which prevents driver conflict. These octal buffers and line drivers are designed specifically for low-voltage (3.3-V) VCCoperation, but with the capability to provide a TTL interface to a 5-V system environment. The ’LVTH244A devices are organized as two 4-bit line drivers with separate output-enable (OE)\ inputs. When OE\ is low, the devices pass data from the A inputs to the Y outputs. When OE\ is high, the outputs are in the high-impedance state. To ensure the high-impedance state during power up or power down, OE\ should be tied to VCCthrough a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level. Use of pullup or pulldown resistors with the bus-hold circuitry is not recommended. These devices are fully specified for hot-insertion applications using Ioffand power-up 3-state. The Ioffcircuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down, which prevents driver conflict.