SN74AHC125-EP Series

Enhanced product 4-ch, 2-V to 5.5-V buffers with 3-state outputs

Catalog

Enhanced product 4-ch, 2-V to 5.5-V buffers with 3-state outputs

Part	Number of Elements	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Mounting Type	Output Type	Voltage - Supply [Max]	Voltage - Supply [Min]	Operating Temperature [Min]	Operating Temperature [Max]	Logic Type	Package / Case	Package / Case [y]	Package / Case [x]	Number of Bits per Element	Supplier Device Package	Grade	Qualification	Package / Case [custom]	Package / Case [custom]
Texas Instruments SN74AHC125NS
Texas Instruments SN74AHC125N	4	8 mA	8 mA	Through Hole	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-DIP	7.62 mm	0.3 "	1
Texas Instruments SN74AHC125NSR	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-SOIC	5.3 mm	0.209 "	1	14-SO
Texas Instruments SN74AHC125QDRQ1	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-SOIC	3.9 mm	0.154 in	1		Automotive	AEC-Q100
Texas Instruments SN74AHC125QPWRG4Q1	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-TSSOP			1	14-TSSOP	Automotive	AEC-Q100	0.173 "	4.4 mm
Texas Instruments SN74AHC125D	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-SOIC	3.9 mm	0.154 in	1
Texas Instruments SN74AHC125PW	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-TSSOP			1	14-TSSOP			0.173 "	4.4 mm
Texas Instruments SN74AHC125QDRG4Q1	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-SOIC	3.9 mm	0.154 in	1		Automotive	AEC-Q100
Texas Instruments SN74AHC125QPWRQ1	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-TSSOP			1	14-TSSOP	Automotive	AEC-Q100	0.173 "	4.4 mm
Texas Instruments SN74AHC125DGVR	4	8 mA	8 mA	Surface Mount	3-State	5.5 V	2 V	-40 °C	125 °C	Buffer Non-Inverting	14-TFSOP		0.173 in 4.4 mm	1

Catalog

Enhanced product 4-ch, 2-V to 5.5-V buffers with 3-state outputs

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessOperating Range 2-V to 5.5-V VCCLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 1000 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeEPIC™ (Enhanced-Performance Implanted CMOS) ProcessOperating Range 2-V to 5.5-V VCCLatch-Up Performance Exceeds 250 mA Per JESD 17ESD Protection Exceeds 1000 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.EPIC is a trademark of Texas Instruments.

Description

The SNx4AHC125 devices are quadruple bus buffer gates featuring independent line drivers with 3-state outputs. Each output is disabled when the associated output-enable ( OE) input is high. When OE is low, the respective gate passes the data from the A input to its Y output. To ensure the high-impedance state during power up or power down, OE must be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. The SNx4AHC125 devices are quadruple bus buffer gates featuring independent line drivers with 3-state outputs. Each output is disabled when the associated output-enable ( OE) input is high. When OE is low, the respective gate passes the data from the A input to its Y output. To ensure the high-impedance state during power up or power down, OE must be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.