
SN74LVC74A-Q1 Series
Enhanced Product Dual Positive-Edge-Triggered D-Type Flip-Flops With Clear And Preset
Manufacturer: Texas Instruments
Catalog
Enhanced Product Dual Positive-Edge-Triggered D-Type Flip-Flops With Clear And Preset
Key Features
• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -40°C to 125°C and -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 5.2 ns at 3.3 VTypical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°C(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of -40°C to 125°C and -55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree(1)Operates From 2 V to 3.6 VInputs Accept Voltages to 5.5 VMax tpdof 5.2 ns at 3.3 VTypical VOLP(Output Ground Bounce) <0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot) >2 V at VCC= 3.3 V, TA= 25°C(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Description
AI
The SN74LVC74A dual positive-edge-triggered D-type flip-flop is designed for 2.7-V to 3.6-V VCCoperation.
A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. WhenPREandCLRare inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of this device as a translator in a mixed 3.3 V/5 V system environment.
The SN74LVC74A dual positive-edge-triggered D-type flip-flop is designed for 2.7-V to 3.6-V VCCoperation.
A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. WhenPREandCLRare inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the clock pulse. Following the hold-time interval, data at the D input can be changed without affecting the levels at the outputs.
Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of this device as a translator in a mixed 3.3 V/5 V system environment.