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8-TSSOP
Sensors, Transducers

LM57FEPWQ1

Obsolete
Texas Instruments

AUTOMOTIVE GRADE, ±0.7°C TEMPERATURE SENSOR WITH RESISTOR-PROGRAMMABLE TEMP SWITCH

8-TSSOP
Sensors, Transducers

LM57FEPWQ1

Obsolete
Texas Instruments

AUTOMOTIVE GRADE, ±0.7°C TEMPERATURE SENSOR WITH RESISTOR-PROGRAMMABLE TEMP SWITCH

Technical Specifications

Parameters and characteristics for this part

SpecificationLM57FEPWQ1
Accuracy2.3 °C
Current - Output (Max) [Max]5 mA
Current - Supply24 µA
FeaturesTrip Test, Selectable Trip Point
GradeAutomotive
Mounting TypeSurface Mount
Operating Temperature [Max]150 °C
Operating Temperature [Min]-50 °C
Output FunctionOverTemp
Output Function/OverTemp
Output TypeOpen Collector, Push-Pull
Package / Case8-TSSOP
Package / Case [custom]0.173 "
Package / Case [custom]4.4 mm
QualificationAEC-Q100
Selectable HysteresisFalse
Supplier Device Package8-TSSOP
Switching TemperatureProgrammable
Trip Temperature ThresholdHot
Voltage - Supply [Max]5.5 V
Voltage - Supply [Min]2.4 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
Texas InstrumentsTUBE 1$ 2.21
100$ 1.83
250$ 1.31
1000$ 0.99

Description

General part information

LM57-Q1 Series

The LM57-Q1 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature applications such as automotive grade. The trip temperature (TTRIP) is selected from 256 possible values in the range of –40°C to 160°C. The VTEMPis a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the TTRIPand VTEMPslope. The digital and analog outputs enable protection and monitoring of system thermal events.

Built-in thermal hysteresis (THYST) prevents the digital outputs from oscillating. The TOVERandTOVERdigital outputs will assert when the die temperature exceeds TTRIPand will de-assert when the temperature falls below a temperature equal to TTRIPminus THYST.

TOVERis active-high with a push-pull structure.TOVERis active-low with an open-drain structure. Tying TOVERto TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of TOVERorTOVER, confirming they changed to an active state. This allows for in situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the VTEMPpin. The system could then use this voltage to calculate the threshold of the LM57-Q1.