LM57-Q1 Series
Automotive Grade, ±0.7°C Temperature Sensor with Resistor-Programmable Temp Switch
Manufacturer: Texas Instruments
Catalog
Automotive Grade, ±0.7°C Temperature Sensor with Resistor-Programmable Temp Switch
| Part | Voltage - Supply [Min] | Voltage - Supply [Max] | Switching Temperature | Features | Accuracy | Selectable Hysteresis | Operating Temperature [Max] | Operating Temperature [Min] | Output Function | Output Function | Current - Supply | Output Type | Supplier Device Package | Mounting Type | Trip Temperature Threshold | Package / Case | Qualification | Grade | Current - Output (Max) [Max] | Package / Case [custom] | Package / Case [custom] |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
 Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 150 °C | -50 °C | OverTemp | /OverTemp | 24 µA | Open Drain Push-Pull | 8-WSON (2.5x2.5) | Surface Mount | Hot | 8-WFDFN Exposed Pad | ||||||
 Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point | 2.3 °C | 125 °C | -50 °C | OverTemp | /OverTemp | 24 µA | Open Collector Push-Pull | 8-TSSOP | Surface Mount | Hot | 8-TSSOP | AEC-Q100 | Automotive | 5 mA | 0.173 " | 4.4 mm | |
Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 150 °C | -50 °C | OverTemp | /OverTemp | 24 µA | Open Drain Push-Pull | 8-TSSOP | Surface Mount | Hot | 8-TSSOP | AEC-Q100 | Automotive | 5 mA | 0.173 " | 4.4 mm | |
Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 160 °C | -50 °C | OverTemp | /OverTemp | 26 µA | Open Drain Push-Pull | 8-TSSOP | Surface Mount | Hot | 8-TSSOP | AEC-Q100 | Automotive | 5 mA | 0.173 " | 4.4 mm | |
Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 150 °C | -50 °C | OverTemp | /OverTemp | 24 µA | Open Collector Push-Pull | 8-TSSOP | Surface Mount | Hot | 8-TSSOP | AEC-Q100 | Automotive | 5 mA | 0.173 " | 4.4 mm | |
Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 160 °C | -50 °C | OverTemp | /OverTemp | 26 µA | Open Drain Push-Pull | 8-TSSOP | Surface Mount | Hot | 8-TSSOP | AEC-Q100 | Automotive | 5 mA | 0.173 " | 4.4 mm | |
Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 150 °C | -50 °C | OverTemp | /OverTemp | 24 µA | Open Drain Push-Pull | 8-WSON (2.5x2.5) | Surface Mount | Hot | 8-WFDFN Exposed Pad | ||||||
Texas Instruments | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 125 °C | -50 °C | OverTemp | /OverTemp | 24 µA | Open Drain Push-Pull | 8-TSSOP | Surface Mount | Hot | 8-TSSOP | AEC-Q100 | Automotive | 5 mA | 0.173 " | 4.4 mm | |||
Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 2.3 °C | 160 °C | -50 °C | OverTemp | /OverTemp | 26 µA | Open Drain Push-Pull | 8-TSSOP | Surface Mount | Hot | 8-TSSOP | AEC-Q100 | Automotive | 5 mA | 0.173 " | 4.4 mm | |
 Texas Instruments | 2.4 V | 5.5 V | Programmable | Selectable Trip Point Trip Test | 1.5 °C | 150 °C | -50 °C | OverTemp | /OverTemp | 24 µA | Open Drain Push-Pull | 8-WSON (3x3) | Surface Mount | Hot | 8-WFDFN Exposed Pad |
Key Features
• Qualified for Automotive Applications, forCommercial Device See LM57 Data SheetAEC-Q100 Qualified with the Following Results:Temperature Grade 0 Extended: −50°C to+160°C with Excursions up to 170°C OperatingTemperature RangeTemperature Grade 0: −50°C to +150°COperating Temperature RangeTemperature Grade 1: −50°C to +125°COperating Temperature RangeHBM ESD Component Classification Level 2CDM ESD Component Classification Level C5Trip Temperature Set by External Resistors withAccuracy of ±2.3°C from −40°C to +150°CResistor Tolerance Contributes Zero ErrorPush-Pull and Open-Drain Switch OutputsWide Operating Temperature Range of −50°C to160°CVery Linear Analog VTEMPTemp Sensor Outputwith ±1.3°C Accuracy from −50°C to +150°CShort-Circuit Protected Analog and Digital OutputsLatching Function for Digital OutputsTRIP-TEST Pin Allows In-System TestingLow Power Minimizes Self-Heating to Under 0.02°CQualified for Automotive Applications, forCommercial Device See LM57 Data SheetAEC-Q100 Qualified with the Following Results:Temperature Grade 0 Extended: −50°C to+160°C with Excursions up to 170°C OperatingTemperature RangeTemperature Grade 0: −50°C to +150°COperating Temperature RangeTemperature Grade 1: −50°C to +125°COperating Temperature RangeHBM ESD Component Classification Level 2CDM ESD Component Classification Level C5Trip Temperature Set by External Resistors withAccuracy of ±2.3°C from −40°C to +150°CResistor Tolerance Contributes Zero ErrorPush-Pull and Open-Drain Switch OutputsWide Operating Temperature Range of −50°C to160°CVery Linear Analog VTEMPTemp Sensor Outputwith ±1.3°C Accuracy from −50°C to +150°CShort-Circuit Protected Analog and Digital OutputsLatching Function for Digital OutputsTRIP-TEST Pin Allows In-System TestingLow Power Minimizes Self-Heating to Under 0.02°C
Description
AI
The LM57-Q1 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature applications such as automotive grade. The trip temperature (TTRIP) is selected from 256 possible values in the range of –40°C to 160°C. The VTEMPis a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the TTRIPand VTEMPslope. The digital and analog outputs enable protection and monitoring of system thermal events.
Built-in thermal hysteresis (THYST) prevents the digital outputs from oscillating. The TOVERandTOVERdigital outputs will assert when the die temperature exceeds TTRIPand will de-assert when the temperature falls below a temperature equal to TTRIPminus THYST.
TOVERis active-high with a push-pull structure.TOVERis active-low with an open-drain structure. Tying TOVERto TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of TOVERorTOVER, confirming they changed to an active state. This allows for in situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the VTEMPpin. The system could then use this voltage to calculate the threshold of the LM57-Q1.
The LM57-Q1 device is a precision, dual-output, temperature switch with analog temperature sensor output for wide temperature applications such as automotive grade. The trip temperature (TTRIP) is selected from 256 possible values in the range of –40°C to 160°C. The VTEMPis a class AB analog voltage output that is proportional to temperature with a programmable negative temperature coefficient (NTC). Two external 1% resistors set the TTRIPand VTEMPslope. The digital and analog outputs enable protection and monitoring of system thermal events.
Built-in thermal hysteresis (THYST) prevents the digital outputs from oscillating. The TOVERandTOVERdigital outputs will assert when the die temperature exceeds TTRIPand will de-assert when the temperature falls below a temperature equal to TTRIPminus THYST.
TOVERis active-high with a push-pull structure.TOVERis active-low with an open-drain structure. Tying TOVERto TRIP-TEST will latch the output after it trips. The output can be cleared by forcing TRIP-TEST low. Driving the TRIP-TEST high will assert the digital outputs. A processor can check the state of TOVERorTOVER, confirming they changed to an active state. This allows for in situ verification that the comparator and output circuitry are functional after system assembly. When TRIP-TEST is high, the trip-level reference voltage appears at the VTEMPpin. The system could then use this voltage to calculate the threshold of the LM57-Q1.