
AD7626BCPZ
ActiveANALOG TO DIGITAL CONVERTER, 16 BIT, 10 MSPS, DIFFERENTIAL, LVDS, SERIAL, SINGLE, 2.37 V
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AD7626BCPZ
ActiveANALOG TO DIGITAL CONVERTER, 16 BIT, 10 MSPS, DIFFERENTIAL, LVDS, SERIAL, SINGLE, 2.37 V
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Technical Specifications
Parameters and characteristics for this part
| Specification | AD7626BCPZ |
|---|---|
| Architecture | SAR |
| Configuration | ADC |
| Data Interface | LVDS - Serial |
| Input Type | Differential |
| Mounting Type | Surface Mount |
| Number of A/D Converters | 1 |
| Number of Bits | 16 |
| Number of Inputs | 1 |
| Operating Temperature [Max] | 85 °C |
| Operating Temperature [Min] | -40 °C |
| Package / Case | 32-WFQFN Exposed Pad, CSP |
| Reference Type | External, Internal |
| Sampling Rate (Per Second) | 10 M |
| Supplier Device Package | 32-LFCSP-WQ (5x5) |
| Voltage - Supply, Analog | 5 V |
| Voltage - Supply, Digital [Max] | 2.63 V |
| Voltage - Supply, Digital [Min] | 2.37 V |
Pricing
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Description
General part information
AD7626 Series
The AD7626 is a 16-bit, 10 MSPS, charge redistribution successive approximation register (SAR) based architecture analog-to-digital converter (ADC). SAR architecture allows unmatched performance both in noise (91.5 dB SNR) and in linearity (±0.45 LSB INL). The AD7626 contains a high speed, 16-bit sampling ADC, an internal conversion clock, and an internal buffered reference. On the CNV edge, it samples the voltage difference between the IN+ and IN− pins. The voltages on these pins swing in opposite phase between 0 V and REF. The 4.096 V reference voltage, REF, can be generated internally or applied externally.All converted results are available on a single low voltage differential signaling (LVDS) self clocked or echoed clock serial interface, reducing external hardware connections.The AD7626 is housed in a 32-lead, 5 mm × 5 mm LFCSP with operation specified from −40°C to +85°C.ApplicationsDigital imaging systems– Digital X-ray– Digital MRI– CCD and IR camerasHigh speed data acquisitionHigh dynamic range telecommunications receiversSpectrum analysisTest equipment
Documents
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