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8-LFCSP
Integrated Circuits (ICs)

ADA4523-1BCPZ-RL7

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Analog Devices

36 V, LOW NOISE, ZERO DRIFT OP AMP

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8-LFCSP
Integrated Circuits (ICs)

ADA4523-1BCPZ-RL7

Active
Analog Devices

36 V, LOW NOISE, ZERO DRIFT OP AMP

Technical Specifications

Parameters and characteristics for this part

SpecificationADA4523-1BCPZ-RL7
Amplifier TypeZero-Drift
Current - Input Bias125 pA
Current - Output / Channel36 mA
Current - Supply4.5 mA
Gain Bandwidth Product5 MHz
Mounting TypeSurface Mount
Number of Circuits1
Operating Temperature [Max]125 °C
Operating Temperature [Min]-40 °C
Output TypeRail-to-Rail
Package / Case8-WFDFN Exposed Pad, CSP
Slew Rate1.85 V/µs
Supplier Device Package8-LFCSP (3x3)
Voltage - Input Offset0.5 µV
Voltage - Supply Span (Max) [Max]36 V
Voltage - Supply Span (Min) [Min]4.5 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyCut Tape (CT) 1$ 4.13
10$ 2.66
25$ 2.28
100$ 1.85
250$ 1.63
500$ 1.50
Digi-Reel® 1$ 4.13
10$ 2.66
25$ 2.28
100$ 1.85
250$ 1.63
500$ 1.50
Tape & Reel (TR) 1500$ 1.36

Description

General part information

ADA4523-1 Series

The ADA4523-1 is a high voltage, low noise, zero drift op amp that offers precision dc performance over a wide supply range of 4.5 V to 36 V. Offset voltage and 1/f noise are suppressed, allowing this op amp to achieve a maximum offset voltage of ±4 µV and a 0.1 Hz to 10 Hz input noise voltage of 88 nV p-p typical.The self calibrating circuitry of the ADA4523-1 results in low offset voltage drift with temperature (0.01 µV/°C maximum) and zero drift over time. Additionally, the ADA4523-1 uses on-chip filtering to achieve high immunity to electromagnetic interference (EMI).Wide supply range, combined with low noise, low offset, 168 dB power supply rejection ratio (PSRR), and 160 dB common-mode rejection ratio (CMRR), make the ADA4523-1 well suited for high dynamic range test, measurement, and instrumentation systems.ApplicationsHigh resolution data acquisitionReference bufferingTest and measurementElectronic scalesThermocouple amplifiersStrain gagesLow-side current sense