
EVAL-AD5522EBUZ
ActiveBOARD EVAL FOR 12X12MM AD5522
Deep-Dive with AI
Search across all available documentation for this part.

EVAL-AD5522EBUZ
ActiveBOARD EVAL FOR 12X12MM AD5522
Deep-Dive with AI
Technical Specifications
Parameters and characteristics for this part
| Specification | EVAL-AD5522EBUZ |
|---|---|
| Contents | Board(s) |
| Function | Parametric Measurement Unit (PMU) |
| Supplied Contents | Board(s) |
| Type | Test and Measurement |
| Utilized IC / Part | AD5522 |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
| Digikey | Box | 1 | $ 107.61 | |
Description
General part information
AD5522 Series
The AD5522 is a high performance, highly integrated parametric measurement unit consisting of four independent channels. Each per-pin parametric measurement unit (PPMU) channel includes five 16-bit, voltage output DACs that set the programmable input levels for the force voltage inputs, clamp inputs, and comparator inputs (high and low). Five programmable force and measure current ranges are available, ranging from ±5 μA to ±80 mA. Four of these ranges use on-chip sense resistors; one high current range up to ±80 mA is available per channel using off-chip sense resistors. Currents in excess of ±80 mA require an external amplifier. Low capacitance DUT connections (FOH and EXTFOH) ensure that the device is suited to relayless test systems.The PMU functions are controlled via a simple 3-wire serial interface compatible with SPI, QSPI™, MICROWIRE™, and DSP interface standards. Interface clocks of 50 MHz allow fast updating of modes. The low voltage differential signaling (LVDS) interface protocol at 83 MHz is also supported. Comparator outputs are provided per channel for device go-no-go testing and characterization. Control registers allow the user to easily change force or measure conditions, DAC levels, and selected current ranges. The SDO (serial data output) pin allows the user to read back information for diagnostic purposes.APPLICATIONSAutomatic Test Equipment (ATE)Per pin Parametric Measurement UnitContinuity & Leakage TestingDevice Power SupplyInstrumentationSMU (Source Measure Unit)Precision Measurement
Documents
Technical documentation and resources