Test and Measurement

TOP050A05/100G

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ICT SPRING CONTACT TEST PROBE

Test and Measurement

Active

ICT SPRING CONTACT TEST PROBE

Technical Specifications

Parameters and characteristics for this part

Part	Tip Plating	Material - Tip	Current Rating	Material - Body	Length - Overall	Operating Temperature (Min)	Operating Temperature (Max)	Length - Tip	Tip Type	Tip Diameter
Chip Shine / CSRF TOP050H05/200G	Gold Plated	Beryllium Copper Steel	3 A	Gold Plated Phosphor Copper	1.7 in	-55 °C	120 °C	0.272 in	Spring Tip - Crown Head	0.02 in
Chip Shine / CSRF TOP050I05/100G	Gold Plated	Beryllium Copper Steel	3 A	Gold Plated Phosphor Copper	1.7 in	-55 °C	120 °C	0.272 in	Spring Tip - Serrated Head	0.02 in
Chip Shine / CSRF TOP050I064/200G	Gold Plated	Beryllium Copper Steel	3 A	Gold Plated Phosphor Copper	1.7 in	-55 °C	120 °C	0.272 in	Spring Tip - Serrated Head	0.025 in
Chip Shine / CSRF TOP050I05/200G	Gold Plated	Beryllium Copper Steel	3 A	Gold Plated Phosphor Copper	1.7 in	-55 °C	120 °C	0.272 in	Spring Tip - Serrated Head	0.02 in
Chip Shine / CSRF TOP050A05/100G	Gold Plated	Beryllium Copper Steel	3 A	Gold Plated Phosphor Copper	1.7 in	-55 °C	120 °C	0.272 in	Spring Tip - Pyramid Head	0.02 in
Chip Shine / CSRF TOP050I064/100G	Gold Plated	Beryllium Copper Steel	3 A	Gold Plated Phosphor Copper	1.7 in	-55 °C	120 °C	0.272 in	Spring Tip - Serrated Head	0.025 in
Chip Shine / CSRF TOP050W05/200G	Gold Plated	Beryllium Copper Steel	3 A	Gold Plated Phosphor Copper	1.7 in	-55 °C	120 °C	0.272 in	Spring Tip - Dagger Head	0.02 in

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

3D models and CAD resources for this part

General part information

3 A Spring Tip - Pyramid Head, 0.020" (0.50mm) Dia

Technical documentation and resources