TOP050 Series
Manufacturer: Chip Shine / CSRF
ICT SPRING CONTACT TEST PROBE
| Part | Material - Tip [custom] | Current Rating (Amps) | Material - Body | Length - Overall [x] | Length - Overall [x] | Length - Tip | Length - Tip | Tip Type [diameter] | Tip Type [diameter] | Tip Type | Tip Type [diameter] |
|---|---|---|---|---|---|---|---|---|---|---|---|
Chip Shine / CSRF | Beryllium Copper Gold Plated Steel | 3 A | Phosphor Copper Gold Plated | 1.7 in | 43.15 mm | 6.9 mm | 0.272 in | 0.02 in | 0.5 mm | Spring Tip - Crown Head | |
Chip Shine / CSRF | Beryllium Copper Gold Plated Steel | 3 A | Phosphor Copper Gold Plated | 1.7 in | 43.15 mm | 6.9 mm | 0.272 in | 0.02 in | 0.5 mm | Spring Tip - Serrated Head | |
Chip Shine / CSRF | Beryllium Copper Gold Plated Steel | 3 A | Phosphor Copper Gold Plated | 1.7 in | 43.15 mm | 6.9 mm | 0.272 in | 0.025 in | Spring Tip - Serrated Head | 0.64 mm | |
Chip Shine / CSRF | Beryllium Copper Gold Plated Steel | 3 A | Phosphor Copper Gold Plated | 1.7 in | 43.15 mm | 6.9 mm | 0.272 in | 0.02 in | 0.5 mm | Spring Tip - Serrated Head | |
Chip Shine / CSRF | Beryllium Copper Gold Plated Steel | 3 A | Phosphor Copper Gold Plated | 1.7 in | 43.15 mm | 6.9 mm | 0.272 in | 0.02 in | 0.5 mm | Spring Tip - Pyramid Head | |
Chip Shine / CSRF | Beryllium Copper Gold Plated Steel | 3 A | Phosphor Copper Gold Plated | 1.7 in | 43.15 mm | 6.9 mm | 0.272 in | 0.025 in | Spring Tip - Serrated Head | 0.64 mm | |
Chip Shine / CSRF | Beryllium Copper Gold Plated Steel | 3 A | Phosphor Copper Gold Plated | 1.7 in | 43.15 mm | 6.9 mm | 0.272 in | 0.02 in | 0.5 mm | Spring Tip - Dagger Head |