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32-LFCSP-WQ
Integrated Circuits (ICs)

AD7625BCPZRL7

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Analog Devices

1-CHANNEL SINGLE ADC SAR 6MSPS 16-BIT SERIAL 32-PIN LFCSP EP T/R

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32-LFCSP-WQ
Integrated Circuits (ICs)

AD7625BCPZRL7

Active
Analog Devices

1-CHANNEL SINGLE ADC SAR 6MSPS 16-BIT SERIAL 32-PIN LFCSP EP T/R

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Technical Specifications

Parameters and characteristics for this part

SpecificationAD7625BCPZRL7
ArchitectureSAR
ConfigurationADC
Data InterfaceLVDS - Serial
Input TypeDifferential
Mounting TypeSurface Mount
Number of A/D Converters1
Number of Bits16
Number of Inputs1
Operating Temperature [Max]85 °C
Operating Temperature [Min]-40 °C
Package / Case32-WFQFN Exposed Pad, CSP
Reference TypeExternal, Internal
Sampling Rate (Per Second)6 M
Supplier Device Package32-LFCSP-WQ (5x5)
Voltage - Supply, Analog5 V
Voltage - Supply, Digital [Max]2.63 V
Voltage - Supply, Digital [Min]2.37 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTape & Reel (TR) 1500$ 43.26

Description

General part information

AD7625 Series

The AD7625 is a 16-bit, 6 MSPS, charge redistribution successive approximation register (SAR) based architecture analog-to-digital converter (ADC). SAR architecture allows unmatched performance both in noise (93 dB SNR) and in linearity (1 LSB). The AD7625 contains a high speed, 16-bit sampling ADC, an internal conversion clock, and an internal buffered reference. On the CNV± rising edge, it samples the voltage difference between the IN+ and IN− pins. The voltages on these pins swing in opposite phase between 0 V and REF. The 4.096 V reference voltage, REF, can be generated internally or applied externally.All converted results are available on a single LVDS self-clocked or echoed-clock serial interface, reducing external hardware connections.The AD7625 is housed in a 32-lead, 5 mm × 5 mm LFCSP with operation specified from −40°C to +85°C.APPLICATIONSHigh dynamic range telecommunicationsReceiversDigital imaging systemsHigh speed data acquisitionSpectrum analysisTest equipment