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DRV8343S-Q1EVM
Development Boards, Kits, Programmers

DRV8343S-Q1EVM

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Texas Instruments

HALL EFFECT SENSOR

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DRV8343S-Q1EVM
Development Boards, Kits, Programmers

DRV8343S-Q1EVM

Active
Texas Instruments

HALL EFFECT SENSOR

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics for this part

SpecificationDRV8343S-Q1EVM
Embedded16-Bit, MCU
EmbeddedTrue
FunctionMotor Controller/Driver
Primary AttributesMotors (BLDC)
Secondary AttributesGraphical User Interface (GUI)
Supplied ContentsBoard(s)
TypePower Management

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyBox 1$ 178.80

Description

General part information

DRV8343-Q1 Series

The DRV8343-Q1 device is an integrated gate driver for three-phase applications. The device provides three half-bridge gate drivers, each capable of driving high-side and low-side N-channel power MOSFETs. The dedicated Source and Drain pins enable the independent MOSFET control for solenoid application. The DRV8343-Q1 generates the correct gate drive voltages using an integrated charge pump sufficient for the high-side MOSFETs and a linear regulator for the low-side MOSFETs. The Smart Gate Drive architecture supports peak gate drive currents up to 1-A source and 2-A. The DRV8343-Q1 can operate from a single power supply and supports a wide input supply range of 5.5 to 60 V for the gate driver.

The 6x, 3x, 1x, and independent input PWM modes allow for simple interfacing to controller circuits. The configuration settings for the gate driver and device are highly configurable through the SPI or hardware (H/W) interface. The DRV8343-Q1 device integrates three low-side current sense amplifiers that allow bidirectional current sensing on all three phases of the drive stage.

A low-power sleep mode is provided to achieve low quiescent current. Internal protection functions are provided for undervoltage lockout, charge pump fault, MOSFET overcurrent, MOSFET short circuit, phase-node short to supply and ground, gate driver fault, and overtemperature. Fault conditions are indicated on the nFAULT pin with details through the device registers for the SPI device variant.

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