
Deep-Dive with AI
Search across all available documentation for this part.

Deep-Dive with AI
Technical Specifications
Parameters and characteristics for this part
| Specification | AD5535BKBC |
|---|---|
| Architecture | String DAC |
| Data Interface | DSP, SPI |
| Differential Output | False |
| Mounting Type | Surface Mount |
| Number of Bits | 14 |
| Number of D/A Converters | 32 |
| Operating Temperature [Max] | 85 °C |
| Operating Temperature [Min] | -10 °C |
| Output Type | Voltage - Buffered |
| Package / Case | CSPBGA, 124-LBGA |
| Reference Type | External |
| Settling Time | 65 µs |
| Supplier Device Package | 124-CSPBGA (15x15) |
| Voltage - Supply, Analog | 5 V |
| Voltage - Supply, Digital [Max] | 5.25 V |
| Voltage - Supply, Digital [Min] | 2.7 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
Description
General part information
AD5535B Series
The AD5535B is a 32-channel, 14-bitdenseDAC®with an on-chip high voltage output amplifier. This device is targeted for optical micro-electromechanical systems. The output voltage range is programmable via the REF_IN pin. The output range is 0 V to 50 V when REF_IN = 1 V, and 0 V to 200 V when REF_IN = 4 V. Each amplifier can source 550 μA, which is ideal for the deflection and control of optical MEMS mirrors.The selected digital-to-analog converter (DAC) register is written to via the 3-wire interface. The serial interface operates at clock rates of up to 30 MHz and is compatible with DSP and micro-controller interface standards.The device is operated with AVCC= 4.75 V to 5.25 V, DVCC= 2.7 V to 5.25 V, V+= 4.75 V to 5.25 V, and VPPof up to 225 V. REF_IN is buffered internally on the AD5535B and should be driven from a stable reference source.ApplicationsOptical microelectromechanical systems (MEMS)Optical crosspoint switchesMicropositioning applications using piezoelectric actuatorsLevel setting in automotive test and measurement
Documents
Technical documentation and resources