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TOP1XXXXXX/XXXG
Test and Measurement

TOP100I064/200G

Active
Chip Shine / CSRF

ICT SPRING CONTACT TEST PROBE

TOP1XXXXXX/XXXG
Test and Measurement

TOP100I064/200G

Active
Chip Shine / CSRF

ICT SPRING CONTACT TEST PROBE

Technical Specifications

Parameters and characteristics for this part

SpecificationTOP100I064/200G
Current Rating3 A
Length - Overall1.31 in
Length - Tip0.329 in
Material - BodyGold Plated, Phosphor Copper
Material - TipSteel, Beryllium Copper
Operating Temperature (Max)120 °C
Operating Temperature (Min)-55 °C
Tip Diameter0.025 in
Tip PlatingGold Plated
Tip TypeSpring Tip - Serrated Head

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$Updated
DigikeyBox 100$ 0.96<4d
200$ 0.90
500$ 0.85
1000$ 0.78
2500$ 0.72
5000$ 0.66

CAD

3D models and CAD resources for this part

Description

General part information

TOP100 Series

3 A Spring Tip - Serrated Head, 0.025" (0.64mm) Dia

Documents

Technical documentation and resources