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Texas Instruments-LM1085IT-3.3 Linear Regulators LDO Regulator Pos 3.3V 3A 3-Pin(3+Tab) TO-220 Rail
Integrated Circuits (ICs)

LM2990T-15

Obsolete
Texas Instruments

LDO REGULATOR NEG -15V 1.8A 3-PIN(3+TAB) TO-220 TUBE

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Texas Instruments-LM1085IT-3.3 Linear Regulators LDO Regulator Pos 3.3V 3A 3-Pin(3+Tab) TO-220 Rail
Integrated Circuits (ICs)

LM2990T-15

Obsolete
Texas Instruments

LDO REGULATOR NEG -15V 1.8A 3-PIN(3+TAB) TO-220 TUBE

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics for this part

SpecificationLM2990T-15
Current - Output1.8 A
Current - Quiescent (Iq)1 mA
Current - Supply (Max) [Max]5 mA
Mounting TypeThrough Hole
Number of Regulators1
Operating Temperature [Max]125 °C
Operating Temperature [Min]-40 °C
Output ConfigurationNegative
Output Type1.81 mOhm
Package / CaseTO-220-3
PSRR52 dB
Supplier Device PackageTO-220-3
Voltage - Input (Max) [Max]-26 V
Voltage - Output (Min/Fixed)-15 V
Voltage Dropout (Max) [Max]1 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

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Description

General part information

LM2990 Series

The LM2990 is a three-terminal, low-dropout, 1-A negative voltage regulator available with fixed output voltages of −5 V, −5.2 V, −12 V, and −15 V.

The LM2990 uses circuit design techniques to provide low-dropout and low-quiescent current. The dropout voltage at 1-A load current is typically 0.6 V and an ensured worst-case maximum of 1 V over the entire operating temperature range. The quiescent current is typically 1 mA with 1-A load current and an input-output voltage differential greater than 3 V. A unique circuit design of the internal bias supply limits the quiescent current to only 9 mA (typical) when the regulator is in the dropout mode (VOUT− VIN≤ 3 V). Output voltage accuracy is ensured to ±5% over load and temperature extremes.

The LM2990 also implements short-circuit proof, and thermal shutdown includes hysteresis to enhance the reliability of the device when overloaded for an extended period of time.

Documents

Technical documentation and resources