Zenode.ai Logo
Beta
DDPAK/TO-263-3
Integrated Circuits (ICs)

LM2990S-12

Obsolete
Texas Instruments

IC REG LIN -12V 1.8A DDPAK

Deep-Dive with AI

Search across all available documentation for this part.

DocumentsDatasheet
DDPAK/TO-263-3
Integrated Circuits (ICs)

LM2990S-12

Obsolete
Texas Instruments

IC REG LIN -12V 1.8A DDPAK

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics for this part

SpecificationLM2990S-12
Current - Output1.8 A
Current - Quiescent (Iq)1 mA
Current - Supply (Max) [Max]5 mA
Mounting TypeSurface Mount
Number of Regulators1
Operating Temperature [Max]125 °C
Operating Temperature [Min]-40 °C
Output ConfigurationNegative
Output Type1.81 mOhm
Package / CaseTO-263AA, D2PAK (3 Leads + Tab), TO-263-4
PSRR52 dB
Supplier Device PackageTO-263 (DDPAK-3)
Voltage - Input (Max) [Max]-26 V
Voltage - Output (Min/Fixed)-12 V
Voltage Dropout (Max) [Max]1 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTube 1$ 7.73
10$ 5.28
25$ 4.65
100$ 3.95

Description

General part information

LM2990 Series

The LM2990 is a three-terminal, low-dropout, 1-A negative voltage regulator available with fixed output voltages of −5 V, −5.2 V, −12 V, and −15 V.

The LM2990 uses circuit design techniques to provide low-dropout and low-quiescent current. The dropout voltage at 1-A load current is typically 0.6 V and an ensured worst-case maximum of 1 V over the entire operating temperature range. The quiescent current is typically 1 mA with 1-A load current and an input-output voltage differential greater than 3 V. A unique circuit design of the internal bias supply limits the quiescent current to only 9 mA (typical) when the regulator is in the dropout mode (VOUT− VIN≤ 3 V). Output voltage accuracy is ensured to ±5% over load and temperature extremes.

The LM2990 also implements short-circuit proof, and thermal shutdown includes hysteresis to enhance the reliability of the device when overloaded for an extended period of time.

Documents

Technical documentation and resources