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SLC49A
Integrated Circuits (ICs)

SCANSTA101SMX/NOPB

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Texas Instruments

LOW VOLTAGE IEEE 1149.1 SYSTEM TEST ACCESS (STA) MASTER

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SLC49A
Integrated Circuits (ICs)

SCANSTA101SMX/NOPB

Active
Texas Instruments

LOW VOLTAGE IEEE 1149.1 SYSTEM TEST ACCESS (STA) MASTER

Technical Specifications

Parameters and characteristics for this part

SpecificationSCANSTA101SMX/NOPB
ApplicationsTesting Equipment
InterfaceIEEE 1149.1
Mounting TypeSurface Mount
Package / Case49-LFBGA
Supplier Device Package49-NFBGA (7x7)
Voltage - Supply [Max]3.6 V
Voltage - Supply [Min]3 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTape & Reel (TR) 2000$ 11.49
Texas InstrumentsLARGE T&R 1$ 14.75
100$ 12.89
250$ 9.94
1000$ 8.89

Description

General part information

SCANSTA101 Series

The SCANSTA101 is designed to function as a test master for an IEEE 1149.1 boundary scan test system. It is suitable for use in embedded IEEE 1149.1 applications and as a component in a stand-alone boundary scan tester.

The SCANSTA101 is an enhanced version of, and a replacement for, the SCANPSC100. The SCANSTA101 supports the IEEE 1149.1 Test Access Port (TAP) standard and the IEEE 1532 standard for in-system configuration of programmable devices.

The SCANSTA101 improves test vector throughput and reduces software overhead in the system processor. The SCANSTA101 presents a simple, register-based interface to the system processor. Texas Instruments provides C-language source code which can be included in the embedded system software. The combination of the SCANSTA101 and its support software comprises a simple API for boundary scan operations.