Integrated Circuits (ICs)

SN74ABT8952DL

Obsolete

IC SCAN-TEST-DEV/XCVR 28-SSOP

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Integrated Circuits (ICs)

Obsolete

IC SCAN-TEST-DEV/XCVR 28-SSOP

Technical Specifications

Parameters and characteristics for this part

Specification	SN74ABT8952DL

Logic Type	Scan Test Device with Registered Bus Transceiver
Mounting Type	Surface Mount
Number of Bits	8
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 C
Package / Case	28-BSSOP (0.295", 7.50mm Width)
Supplier Device Package	28-BSSOP
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Number of Bits	Package / Case [custom]	Package / Case	Package / Case [custom]	Supply Voltage [Max]	Supply Voltage [Min]	Operating Temperature [Max]	Operating Temperature [Min]	Logic Type	Supplier Device Package	Mounting Type
Texas Instruments SN74ABT8952DWR	8	0.295 "	28-SOIC	7.5 mm	5.5 V	4.5 V	85 °C	-40 C	Scan Test Device with Registered Bus Transceiver	28-SOIC	Surface Mount
Texas Instruments SN74ABT8952DL	8		28-BSSOP (0.295" 7.50mm Width)		5.5 V	4.5 V	85 °C	-40 C	Scan Test Device with Registered Bus Transceiver	28-BSSOP	Surface Mount
Texas Instruments SN74ABT8952DW	8	0.295 "	28-SOIC	7.5 mm	5.5 V	4.5 V	85 °C	-40 C	Scan Test Device with Registered Bus Transceiver	28-SOIC	Surface Mount

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General part information

Scan Test Device with Registered Bus Transceiver IC 28-BSSOP

Technical documentation and resources