74ABT8952 Series
Manufacturer: Texas Instruments
IC SCAN TEST DEVICE 28SOIC
| Part | Number of Bits | Package / Case [custom] | Package / Case | Package / Case [custom] | Supply Voltage [Max] | Supply Voltage [Min] | Operating Temperature [Max] | Operating Temperature [Min] | Logic Type | Supplier Device Package | Mounting Type |
|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments | 8 | 0.295 " | 28-SOIC | 7.5 mm | 5.5 V | 4.5 V | 85 °C | -40 C | Scan Test Device with Registered Bus Transceiver | 28-SOIC | Surface Mount |
Texas Instruments | 8 | 28-BSSOP (0.295" 7.50mm Width) | 5.5 V | 4.5 V | 85 °C | -40 C | Scan Test Device with Registered Bus Transceiver | 28-BSSOP | Surface Mount | ||
Texas Instruments | 8 | 0.295 " | 28-SOIC | 7.5 mm | 5.5 V | 4.5 V | 85 °C | -40 C | Scan Test Device with Registered Bus Transceiver | 28-SOIC | Surface Mount |