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STMicroelectronics
| Series | Category | # Parts | Status | Description |
|---|---|---|---|---|
| Part | Spec A | Spec B | Spec C | Spec D | Description |
|---|---|---|---|---|---|
| Series | Category | # Parts | Status | Description |
|---|---|---|---|---|
| Part | Spec A | Spec B | Spec C | Spec D | Description |
|---|---|---|---|---|---|
| Part | Category | Description |
|---|---|---|
STMicroelectronics STEVAL-ISA068V1Obsolete | Development Boards Kits Programmers | EVAL BOARD FOR ST1S32 |
STMicroelectronics 74VCXHQ163245TTRObsolete | Integrated Circuits (ICs) | IC TRANSLATION TXRX 2.7V 48TSSOP |
STMicroelectronics | Development Boards Kits Programmers | VNQ9050LAJ EVALUATION BOARD |
STMicroelectronics LSM303DLHCTRObsolete | Sensors Transducers | IMU ACCEL/MAG 3-AXIS I2C 14LGA |
STMicroelectronics M93C56-WMN6TObsolete | Integrated Circuits (ICs) | EEPROM SERIAL-MICROWIRE 2K-BIT 256 X 8/128 X 16 3.3V/5V 8-PIN SO N T/R |
STMicroelectronics | Integrated Circuits (ICs) | STM32U |
STMicroelectronics TS831-3IZObsolete | Integrated Circuits (ICs) | IC SUPERVISOR 1 CHANNEL TO92-3 |
STMicroelectronics STMPE1208SQTRObsolete | Integrated Circuits (ICs) | IC I/O EXPANDER I2C 12B 40QFN |
STMicroelectronics STM32L1-MAGNETObsolete | Development Boards Kits Programmers | IAR EXPERIMENT STM32 L1 EVAL BRD |
STMicroelectronics VNB35N07Obsolete | Integrated Circuits (ICs) | IC PWR DRIVER N-CHAN 1:1 D2PAK |
| Series | Category | # Parts | Status | Description |
|---|---|---|---|---|
| Power Management (PMIC) | 3 | Active | ||
| PMIC | 5 | Active | ||
| Power Management (PMIC) | 2 | Active | ||
| Integrated Circuits (ICs) | 1 | Obsolete | ||
| PMIC | 6 | Obsolete | ||
| Integrated Circuits (ICs) | 1 | Obsolete | ||
VN330SP-EQuad high side smart power solid state relay | Power Management (PMIC) | 2 | Active | The VN330SP-E is a monolithic device developed using VIPower technology, intended to drive four independent resistive or inductive loads with one side connected to ground. Active current limitation prevents dropping of the system power supply in case of shorted load. Built-in thermal shutdown protects the chip from overtemperature and short-circuit. The open drain diagnostic output indicates overtemperature conditions. |
VN340Quad high side smart power solid state relay | Evaluation and Demonstration Boards and Kits | 3 | Active | VN340SP-E & VN340SP-33-E are monolithic devices developed using STMicroelectronics' VIPower technology, intended to drive four independent resistive or inductive loads with one side connected to ground. Active current limitation prevents dropping of the system power supply in case of shorted load. Built-in thermal shutdown protects the chip from overtemperature and short-circuit. The open drain diagnostic output indicates overtemperature conditions. Each I/O is pulled down when the overtemperature condition of the relative channel is verified. |
VN340SP-33-EQuad high side smart power solid state relay | Power Distribution Switches, Load Drivers | 1 | Active | VN340SP-E & VN340SP-33-E are monolithic devices developed using STMicroelectronics' VIPower technology, intended to drive four independent resistive or inductive loads with one side connected to ground. Active current limitation prevents dropping of the system power supply in case of shorted load. Built-in thermal shutdown protects the chip from overtemperature and short-circuit. The open drain diagnostic output indicates overtemperature conditions. Each I/O is pulled down when the overtemperature condition of the relative channel is verified. |
VN340SP-EQuad high side smart power solid state relay | Power Management (PMIC) | 1 | Active | VN340SP-E & VN340SP-33-E are monolithic devices developed using STMicroelectronics' VIPower technology, intended to drive four independent resistive or inductive loads with one side connected to ground. Active current limitation prevents dropping of the system power supply in case of shorted load. Built-in thermal shutdown protects the chip from overtemperature and short-circuit. The open drain diagnostic output indicates overtemperature conditions. Each I/O is pulled down when the overtemperature condition of the relative channel is verified. |