Catalog
Dual Ch Ringing SLIC with Serial Interface
Key Features
• Dual Architecture* Two fully independent integrated SLIC channel
• * No impulse noise crosstalk in any operation states to the listening channel in forward or reverse active states
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• Two Power Supplies* Single user adjusted battery input per channel
• * 3.3 V for VCC
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• High Voltage Design* Meets Comcast Ringing requirements without clipping distortion
• * Robust solution with no damage during extended ringing cycles or switching the ringer on and off
• * Allows use of 50 Ohm protection resistors and lower cost lower current rated protectors
• * Up to -145 V ringing battery Le9540D
• * Up to -100 V ringing battery Le9540C
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• Channel Independent Eight Operating States* Scan state for minimal power dissipation
• * Active Forward Battery (Default Power Up State)
• * Active Forward Battery ICV
• * Active Reverse Battery
• * Tip Open Ground Start
• * Wink
• * Ringing
• * Disconnect (Default Power Up Mode)
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• Per Channel Ringing Inputs for Optimized Interface to BCM SoC Devices* Allows to accept driving signals from per channel voice outputs as well as from PWM outputs
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• Ultra-Low On-Hook Power
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• Loop Start, Ring Trip, and Ground Start Detections* Loop closure detection with hysteresis to minimize dial pulse distortion
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• Thermal Shutdown Protection with Hysteresis
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• Test Load Switch
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• Supports integrated test algorithms
Description
AI
The Le9540 Dual Ringing SLIC device is a dual-channel device optimized to provide battery feed, ringing, and supervision on voice loops found in short-loop VoIP applications. This device is optimized with a serial bus to interface to the Broadcom BCM3383/84/85/90 cable SoCs and BCM6818/28/38 PON SoCs. The Le9540 device operates independently from a single, user-adjusted battery and a +3.3 V VCC per channel. Each channel provides forward and reverse battery feed, voice transmission, power ringing, an ultra low-power scan state, ground start (Tip open), and a disconnect state. A test load switch is also included to support integrated test algorithms.
