SN74HCT244-Q1 Series

Enhanced product 8-ch, 4.5-V to 5.5-V buffers with TTL-compatible CMOS inputs and 3-state outputs

Catalog

Enhanced product 8-ch, 4.5-V to 5.5-V buffers with TTL-compatible CMOS inputs and 3-state outputs

Part	Voltage - Supply [Min]	Voltage - Supply [Max]	Mounting Type	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Number of Elements	Logic Type	Operating Temperature [Max]	Operating Temperature [Min]	Number of Bits per Element	Supplier Device Package	Package / Case	Package / Case [y]	Package / Case [y]	Output Type	Package / Case	Package / Case	Operating Temperature [Max]	Operating Temperature [Min]	Package / Case [x]
Texas Instruments SN74HCT244DWRG4	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting	85 °C	-40 °C	4	20-SOIC	20-SOIC	0.295 in	7.5 mm	3-State
Texas Instruments SN74HCT244NSR	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting	85 °C	-40 °C	4	20-SO	20-SOIC			3-State	0.209 "	5.3 mm
Texas Instruments CD74HCT244M	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting			4	20-SOIC	20-SOIC	0.295 in	7.5 mm	3-State			125 °C	-55 °C
Texas Instruments SN74HCT244QPWREP	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting	125 °C	-40 °C	4	20-TSSOP	20-TSSOP	4.4 mm		3-State					0.173 in
Texas Instruments CD74HCT244ME4	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting			4	20-SOIC	20-SOIC	0.295 in	7.5 mm	3-State			125 °C	-55 °C
Texas Instruments SN74HCT244QPWRQ1	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting	125 °C	-40 °C	4	20-TSSOP	20-TSSOP	4.4 mm		3-State					0.173 in
Texas Instruments CD74HCT244E	4.5 V	5.5 V	Through Hole	6 mA	6 mA	2	Buffer Non-Inverting			4	20-PDIP	20-DIP			3-State	0.3 in	7.62 mm	125 °C	-55 °C
Texas Instruments SN74HCT244DWG4	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting	85 °C	-40 °C	4	20-SOIC	20-SOIC	0.295 in	7.5 mm	3-State
Texas Instruments SN74HCT244NSRG4	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting	85 °C	-40 °C	4	20-SO	20-SOIC			3-State	0.209 "	5.3 mm
Texas Instruments SN74HCT244PWE4	4.5 V	5.5 V	Surface Mount	6 mA	6 mA	2	Buffer Non-Inverting	85 °C	-40 °C	4	20-TSSOP	20-TSSOP	4.4 mm		3-State					0.173 in

Catalog

Enhanced product 8-ch, 4.5-V to 5.5-V buffers with TTL-compatible CMOS inputs and 3-state outputs

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeOperating Voltage Range of 4.5 V to 5.5 VHigh-Current Inverting Outputs Drive Up To 15 LSTTL LoadsLow Power Consumption, 160-µA Max ICCTypical tpd= 13 ns±6-mA Output Drive at 5 VLow Input Current of 1 µA MaxInputs Are TTL-Voltage Compatible3-State Outputs Drive Bus Lines or Buffer Memory Address RegistersComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification PedigreeOperating Voltage Range of 4.5 V to 5.5 VHigh-Current Inverting Outputs Drive Up To 15 LSTTL LoadsLow Power Consumption, 160-µA Max ICCTypical tpd= 13 ns±6-mA Output Drive at 5 VLow Input Current of 1 µA MaxInputs Are TTL-Voltage Compatible3-State Outputs Drive Bus Lines or Buffer Memory Address RegistersComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

These octal buffers and line drivers are designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The SNx4HCT244 devices are organized as two 4-bit buffers or drivers with separate output-enable (OE) inputs. When OE is low, the device passes non inverted data from the A inputs to the Y outputs. When OE is high, the outputs are in the high-impedance state. These octal buffers and line drivers are designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The SNx4HCT244 devices are organized as two 4-bit buffers or drivers with separate output-enable (OE) inputs. When OE is low, the device passes non inverted data from the A inputs to the Y outputs. When OE is high, the outputs are in the high-impedance state.