SN74LV11A-Q1 Series

Enhanced product, 3-ch, 3-input 2-V to 5.5-V high-speed (7 ns) AND gate

Catalog

Enhanced product, 3-ch, 3-input 2-V to 5.5-V high-speed (7 ns) AND gate

Part	Input Logic Level - Low	Mounting Type	Operating Temperature [Max]	Operating Temperature [Min]	Number of Circuits	Number of Inputs	Current - Output High, Low [custom]	Current - Output High, Low [custom]	Input Logic Level - High	Voltage - Supply [Max]	Voltage - Supply [Min]	Max Propagation Delay @ V, Max CL	Logic Type	Package / Case	Package / Case	Package / Case	Current - Quiescent (Max) [Max]	Supplier Device Package	Package / Case [custom]	Package / Case [custom]	Package / Case [x]	Package / Case [y]	Qualification	Grade
Texas Instruments SN74LV11ADBR	0.5 V	Surface Mount	85 °C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate	5.3 mm	14-SSOP	0.209 "	20 µA	14-SSOP
Texas Instruments SN74LV11APWR	0.5 V	Surface Mount	85 °C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-TSSOP		20 µA	14-TSSOP	0.173 "	4.4 mm
Texas Instruments SN74LV11AD	0.5 V	Surface Mount	85 °C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-SOIC		20 µA				0.154 in	3.9 mm
Texas Instruments SN74LV11ATPWRQ1	0.5 V	Surface Mount	105 ░C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-TSSOP		20 µA	14-TSSOP	0.173 "	4.4 mm			AEC-Q100	Automotive
Texas Instruments SN74LV11ANSR	0.5 V	Surface Mount	85 °C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-SOIC		20 µA	14-SO			0.209 "	5.3 mm
Texas Instruments SN74LV11APWT	0.5 V	Surface Mount	85 °C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-TSSOP		20 µA	14-TSSOP	0.173 "	4.4 mm
Texas Instruments SN74LV11ADR	0.5 V	Surface Mount	85 °C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-SOIC		20 µA				0.154 in	3.9 mm
Texas Instruments SN74LV11ATPWRG4Q1	0.5 V	Surface Mount	105 ░C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-TSSOP		20 µA	14-TSSOP	0.173 "	4.4 mm			AEC-Q100	Automotive
Texas Instruments SN74LV11ATPWREP	0.5 V	Surface Mount	105 ░C	-40 °C	3	3	12 mA	12 mA	1.5 V	5.5 V	2 V	7.9 ns	AND Gate		14-TSSOP		20 µA	14-TSSOP	0.173 "	4.4 mm

Catalog

Enhanced product, 3-ch, 3-input 2-V to 5.5-V high-speed (7 ns) AND gate

Key Features

• Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 105°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree2-V to 5.5-V VCCOperationTypical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot)>2.3 V at VCC= 3.3 V, TA= 25°CSupports Mixed-Mode Voltage Operation on All PortsIoffSupports Partial-Power-Down Mode OperationComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –40°C to 105°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product-Change NotificationQualification Pedigree2-V to 5.5-V VCCOperationTypical VOLP(Output Ground Bounce)<0.8 V at VCC= 3.3 V, TA= 25°CTypical VOHV(Output VOHUndershoot)>2.3 V at VCC= 3.3 V, TA= 25°CSupports Mixed-Mode Voltage Operation on All PortsIoffSupports Partial-Power-Down Mode OperationComponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

These triple 3-input positive-AND gates are designed for 2-V to 5.5-V V CC operation. The SN74LV11A-Q1 devices perform the Boolean function Y = A • B • C or Y = A + B + C in positive logic. These devices are fully specified for partial-power-down applications using I off. The I off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. These triple 3-input positive-AND gates are designed for 2-V to 5.5-V V CC operation. The SN74LV11A-Q1 devices perform the Boolean function Y = A • B • C or Y = A + B + C in positive logic. These devices are fully specified for partial-power-down applications using I off. The I off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.