Zenode.ai Logo
Beta
AFE782H1RRUR
Integrated Circuits (ICs)

AFE782H1RRUR

Active
Texas Instruments

LOW-POWER AFE WITH HART ©, 14-BIT DAC, 12-BIT ADC FOR PLC AND SENSOR TRANSMITTER APPLICATIONS

Deep-Dive with AI

Search across all available documentation for this part.

AFE782H1RRUR
Integrated Circuits (ICs)

AFE782H1RRUR

Active
Texas Instruments

LOW-POWER AFE WITH HART ©, 14-BIT DAC, 12-BIT ADC FOR PLC AND SENSOR TRANSMITTER APPLICATIONS

Deep-Dive with AI

Technical Specifications

Parameters and characteristics for this part

SpecificationAFE782H1RRUR
Mounting TypeSurface Mount
Number of Bits12, 16, 14
Number of Channels [custom]2
Package / Case24-WFQFN
Supplier Device Package24-UQFN
Supplier Device Package [x]4
Supplier Device Package [y]4
Voltage - Supply, Analog [Max]1.89 V
Voltage - Supply, Analog [Min]1.71 V
Voltage - Supply, Digital [Max]5.5 V
Voltage - Supply, Digital [Min]1.71 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTape & Reel (TR) 3000$ 4.74
Texas InstrumentsLARGE T&R 1$ 6.97
100$ 5.68
250$ 4.47
1000$ 3.79

Description

General part information

AFE782H1 Series

The 16-bit AFE882H1 and 14-bit AFE782H1 (AFEx82H1) are highly-integrated, high-accuracy, extremely low-power DACs with voltage-outputs designed for HART-enabled process control and industrial automation applications.

The AFEx82H1 devices include most of the components required to design a 4‑mA to 20‑mA, 3‑wire or 4-wire sensor transmitter or analog output module. In addition to the highly accurate DAC, these devices include a HART®-compliant FSK modem, 10-ppm/°C voltage reference, and diagnostic analog-to-digital converter (ADC). To accommodate intrinsic and functional safety concerns, external voltage-to-current conversion and power-regulation are required.

The internal diagnostic ADC is multiplexed to several internal nodes that enable an automatic self-health check. This check is capable of detecting errors or malfunctions of the internal bias sources, power regulator, voltage reference, DAC output, die temperature, and optional external voltage source. If any fault is detected from the diagnostic ADC, CRC frame-error checking, or windowed watchdog timer, the devices can optionally issue an interrupt, enter a user-specified fail-safe state, or both.