SN74BCT8244ADW
ActiveIEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS
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SN74BCT8244ADW
ActiveIEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS
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Technical Specifications
Parameters and characteristics for this part
| Specification | SN74BCT8244ADW |
|---|---|
| Logic Type | Scan Test Device with Buffers |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Operating Temperature [Max] | 70 °C |
| Operating Temperature [Min] | 0 °C |
| Package / Case | 24-SOIC |
| Package / Case [custom] | 7.5 mm |
| Package / Case [custom] | 0.295 in |
| Supplier Device Package | 24-SOIC |
| Supply Voltage [Max] | 5.5 V |
| Supply Voltage [Min] | 4.5 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
| Digikey | Tube | 1 | $ 8.74 | |
| 10 | $ 8.03 | |||
| 25 | $ 7.70 | |||
| 100 | $ 7.33 | |||
| Texas Instruments | TUBE | 1 | $ 11.19 | |
| 100 | $ 9.77 | |||
| 250 | $ 7.53 | |||
| 1000 | $ 6.74 | |||
Description
General part information
SN74BCT8244A Series
The 'BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPETMtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the 'F244 and 'BCT244 octal buffers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETMoctal buffers.
In the test mode, the normal operation of the SCOPETMoctal buffers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations, as described in IEEE Standard 1149.1-1990.
Documents
Technical documentation and resources
