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LMG3526R030RQST
Integrated Circuits (ICs)

LMG3522R050RQSR

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Texas Instruments

650-V 50-MΩ GAN FET WITH INTEGRATED DRIVER, PROTECTION AND TEMPERATURE REPORTING

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LMG3526R030RQST
Integrated Circuits (ICs)

LMG3522R050RQSR

Active
Texas Instruments

650-V 50-MΩ GAN FET WITH INTEGRATED DRIVER, PROTECTION AND TEMPERATURE REPORTING

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics for this part

SpecificationLMG3522R050RQSR
Current - Output (Max) [Max]32 A
Fault ProtectionUVLO, Over Temperature, Current Limiting (Adjustable), Short Circuit
FeaturesSlew Rate Controlled, Status Flag
Input TypeNon-Inverting
InterfacePWM
Mounting TypeWettable Flank, Surface Mount
Number of Outputs1
Operating Temperature [Max]150 °C
Operating Temperature [Min]-40 °C
Output ConfigurationLow Side
Output TypeP-Channel
Package / Case52-VQFN Exposed Pad
Ratio - Input:Output [custom]1:1
Rds On (Typ)43 mOhm
Supplier Device Package52-VQFN (12x12)
Switch TypeGeneral Purpose
Voltage - Load650 V
Voltage - Supply (Vcc/Vdd) [Max]18 V
Voltage - Supply (Vcc/Vdd) [Min]7.5 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyCut Tape (CT) 1$ 17.69
10$ 15.58
100$ 13.48
500$ 12.21
Digi-Reel® 1$ 17.69
10$ 15.58
100$ 13.48
500$ 12.21
Tape & Reel (TR) 2000$ 9.90
Texas InstrumentsLARGE T&R 1$ 13.15
100$ 11.48
250$ 8.86
1000$ 7.92

Description

General part information

LMG3522R050 Series

The LMG352xR050 GaN FET with integrated driver and protection is targeted at switch-mode power converters and enables designers to achieve new levels of power density and efficiency.

The LMG352xR050 integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TI’s low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 15V/ns to 150V/ns, which can be used to actively control EMI and optimize switching performance. The LMG3526R050 includes the zero-voltage detection (ZVD) feature which provides a pulse output from the ZVD pin when zero-voltage switching is realized.

Advanced power management features include digital temperature reporting and fault detection. The temperature of the GaN FET is reported through a variable duty cycle PWM output, which simplifies managing device loading. Faults reported include overcurrent, short-circuit, overtemperature, VDD UVLO, and high-impedance RDRV pin.

Documents

Technical documentation and resources