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CY29FCT818ATDMB
Integrated Circuits (ICs)

CY29FCT818ATDMB

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Texas Instruments

DIAGNOSTIC SCAN REGISTER 24-CDIP

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CY29FCT818ATDMB
Integrated Circuits (ICs)

CY29FCT818ATDMB

Active
Texas Instruments

DIAGNOSTIC SCAN REGISTER 24-CDIP

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics for this part

SpecificationCY29FCT818ATDMB
Logic TypeRegister, Pipeline
Mounting TypeThrough Hole
Number of Bits per Element8
Number of Elements1
Operating Temperature [Max]125 °C
Operating Temperature [Min]-55 °C
Output TypeTri-State
Package / Case24-CDIP
Supplier Device Package24-CDIP
Voltage - Supply [Max]5.25 V
Voltage - Supply [Min]4.75 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
Texas InstrumentsTUBE 1$ 116.00
100$ 112.51
250$ 93.67
1000$ 87.22

Description

General part information

CY29FCT818T-MIL Series

The CY29FCT818T contains a high-speed 8-bit general-purpose data pipeline register and a high-speed 8-bit shadow register. The general-purpose register can be used in an 8-bit-wide data path for a normal system application. The shadow register is designed for applications such as diagnostics in sequential circuits, where it is desirable to load known data at a specific location in the circuit and to read the data at that location.

The shadow register can load data from the output of the device, and can be used as a right-shift register with bit-serial input (SDI) and output (SDO), using DCLK. The data register input is multiplexed to enable loading from the shadow register or from the data input pins, using PCLK. Data can be loaded simultaneously from the shadow register to the pipeline register, and from the pipeline register to the shadow register, provided setup-time and hold-time requirements are satisfied, with respect to the two independent clock inputs.

In a typical application, the general-purpose register in this device replaces an 8-bit data register in the normal data path of a system. The shadow register is placed in an auxiliary bit-serial loop that is used for diagnostics. During diagnostic operation, data is shifted serially into the shadow register, then transferred to the general-purpose register to load a known value into the data path. To read the contents at that point in the data path, the data is transferred from the data register into the shadow register, then shifted serially in the auxiliary diagnostic loop to make it accessible to the diagnostics controller. This data then is compared with the expected value to diagnose faulty operation of the sequential circuit.

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