Zenode.ai Logo
Beta
TO-220-3
Discrete Semiconductor Products

FJP2160DTU

Obsolete
ON Semiconductor

ESBC RATED NPN SILICON TRANSISTOR

Deep-Dive with AI

Search across all available documentation for this part.

TO-220-3
Discrete Semiconductor Products

FJP2160DTU

Obsolete
ON Semiconductor

ESBC RATED NPN SILICON TRANSISTOR

Deep-Dive with AI

Technical Specifications

Parameters and characteristics for this part

SpecificationFJP2160DTU
Current - Collector (Ic) (Max) [Max]2 A
Current - Collector Cutoff (Max) [Max]100 µA
DC Current Gain (hFE) (Min) @ Ic, Vce [Min]20
Frequency - Transition5 MHz
Mounting TypeThrough Hole
Operating Temperature [Max]125 ¯C
Operating Temperature [Min]-55 °C
Package / CaseTO-220-3
Power - Max [Max]100 W
Supplier Device PackageTO-220-3
Transistor TypeNPN
Vce Saturation (Max) @ Ib, Ic750 mV
Voltage - Collector Emitter Breakdown (Max) [Max]800 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$

Description

General part information

FJP2160D Series

The FJP2160D is a low-cost, high performance power switch designed to provide the best performance when used in an ESBC configuration in applications such as: power supplies, motor drivers, Smart Grid, or ignition switches. The power switch is designed to operate up to 1600 volts and up to 3amps while providing exceptionally low on-resistance and very low switching losses.The ESBC switch is designed to be easy to drive using off-the-shelf power supply controllers or drivers. The ESBC MOSFET is a low-voltage, low-cost, surface mount device that combines low-input capacitance and fast switching, The ESBC configuration further minimizes the required driving power because it does not have Miller capacitance.The FJP2160D provides exceptional reliability and a large operating range due to its square reverse-bias-safeoperating-area (RBSOA) and rugged design. The device is avalanche rated and has no parasitic transistors; it is not prone to static dv/dt failures.

Documents

Technical documentation and resources