Specification	SN74LVTH18646APM

Logic Type	ABT Scan Test Device With Transceivers and Registers
Mounting Type	Surface Mount
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 °C
Package / Case	64-LQFP
Supplier Device Package	64-LQFP (10x10)
Supply Voltage [Max]	3.6 V
Supply Voltage [Min]	2.7 VDC

SN74LVTH18646A Series

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers

Part	Supplier Device Package	Supply Voltage [Max]	Supply Voltage [Min]	Mounting Type	Logic Type	Package / Case	Operating Temperature [Max]	Operating Temperature [Min]
Texas Instruments SN74LVTH18646APMG4	64-LQFP (10x10)	3.6 V	2.7 VDC	Surface Mount	ABT Scan Test Device With Transceivers and Registers	64-LQFP	85 °C	-40 °C
Texas Instruments SN74LVTH18646APM	64-LQFP (10x10)	3.6 V	2.7 VDC	Surface Mount	ABT Scan Test Device With Transceivers and Registers	64-LQFP	85 °C	-40 °C

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

Digikey	Tray	1	$ 18.01
		10	$ 16.55
		25	$ 15.86
		160	$ 13.98
		320	$ 13.29
		480	$ 12.43
Texas Instruments	JEDEC TRAY (10+1)	1	$ 14.09
		100	$ 12.31
		250	$ 9.49
		1000	$ 8.49

Description

General part information

SN74LVTH18646A Series

The 'LVTH18646A and 'LVTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Additionally, these devices are designed specifically for low-voltage (3.3-V) VCCoperation, but with the capability to provide a TTL interface to a 5-V system environment.

In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers and registers.