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WSON (DRV)
Circuit Protection

TVS2200DRVR

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Texas Instruments

22V FLAT-CLAMP SURGE PROTECTION DEVICE

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WSON (DRV)
Circuit Protection

TVS2200DRVR

Active
Texas Instruments

22V FLAT-CLAMP SURGE PROTECTION DEVICE

Technical Specifications

Parameters and characteristics for this part

SpecificationTVS2200DRVR
ApplicationsGeneral Purpose
Mounting TypeSurface Mount
Number of Circuits1
Supplier Device Package6-WSON (2x2)
TechnologyInternal Switch
Voltage - Clamping22 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyCut Tape (CT) 1$ 0.74
10$ 0.46
100$ 0.30
500$ 0.23
1000$ 0.20
Digi-Reel® 1$ 0.74
10$ 0.46
100$ 0.30
500$ 0.23
1000$ 0.20
Tape & Reel (TR) 3000$ 0.16
6000$ 0.15
9000$ 0.14
30000$ 0.13
75000$ 0.13
Texas InstrumentsLARGE T&R 1$ 0.30
100$ 0.20
250$ 0.16
1000$ 0.10

Description

General part information

TVS2200 Series

The TVS2200 robustly shunts up to 40 A of IEC 61000-4-5 fault current to protect systems from high power transients or lightning strikes. The device offers a solution to the common industrial signal line EMC requirement to survive up to ±1 kV IEC 61000-4-5 open circuit voltage coupled through a 42 Ω impedance.

The TVS2200 uses a unique feedback mechanism for precise flat clamping during a fault, allowing system exposure below 30 V. The tight voltage regulation allows designers to confidently select system components with a lower voltage tolerance, lowering system costs and complexity without sacrificing robustness.

In addition, the TVS2200 is available in a small 2 mm × 2 mm SON footprint which is designed for space constrained applications, offering a 70 percent reduction in size compared to industry standard SMA and SMB packages. The extremely low device leakage and capacitance causes a minimal effect on the protected line. For robust protection over the lifetime of the product, TI tests the TVS2200 against 5,000 repetitive surge strikes at high temperature with no shift in device performance.