The MAX32001 is a fully integrated, dual channel, high performance, pin-electronics Driver/Comparator/Load (DCL) with built-in level setters and PMU force and sense switches targeting the tester market. Each channel includes a four level pin driver, window comparator, passive load, dynamic clamps, force/sense MUX switches, a high voltage (VHH) programmable level, cable-droop compensation (CDC), and 14 independent level settling DACs. The MAX32001 features programmable CDC for the driver output and for the comparator input, adjustable driver output resistance that allows optimal performance over typical data-path transmission-line variations, slew-rate adjustment, and a programmable super-voltage driver output.The MAX32001 driver features a wide 7.5V (-1.25V to +6.25V) high-speed operating voltage range and a VHH programmable range of 0V up to +13.5V. Operation modes include high-impedance, active-termination (3rd-level drive), and VHH (4th-level drive) modes. The device is highly linear even at low voltage swings. The driver provides highspeed differential control inputs compatible with most high-speed logic families. The window comparators provide extremely low timing variation over changes in slew rate, pulse width, and overdrive voltage. In high-impedance mode, the MAX32001 features dynamic clamps that dampen high-speed device-under-test (DUT) waveforms. The ±14mA passive load facilitates fast contact testing when used in conjunction with the comparators, and functions as a pullup/pulldown for open drain/collector DUT outputs. The PMU force/sense MUX switches offers force and measure current or voltage. A SPI™-compatible serial interface configures the device.The MAX32001 is available in a small footprint, 10mm x 10mm, 68-pin TQFN package with exposed pad on the top for easy heat removal. Power dissipation is 1.05W per channel typical over the full operating voltage range with the passive load disabled. The MAX32001 operates over an internal die temperature range of +50°C to +80°C.ApplicationsMemory ATE TestersSOC ATE TestersWafer Probe TestersDiscrete ATE TestersTest and Measurement Equipment