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Technical Specifications
Parameters and characteristics for this part
| Specification | SN74BCT8374ADWR |
|---|---|
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Operating Temperature [Max] | 70 °C |
| Operating Temperature [Min] | 0 °C |
| Package / Case | 24-SOIC |
| Package / Case [custom] | 7.5 mm |
| Package / Case [custom] | 0.295 in |
| Supplier Device Package | 24-SOIC |
| Supply Voltage [Max] | 5.5 V |
| Supply Voltage [Min] | 4.5 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
Description
General part information
SN74BCT8374A Series
The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETMtestability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the 'F374 and 'BCT374 octal D-type flip-flops. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETMoctal flip-flops.
In the test mode, the normal operation of the SCOPETMoctal flip-flops is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Documents
Technical documentation and resources
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