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Integrated Circuits (ICs)

SN74LVTH182504APM

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3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

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Search across all available documentation for this part.

Documents3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers datasheet (Rev. B)Understanding Advanced Bus-Interface Products Design Guide +17

Integrated Circuits (ICs)

SN74LVTH182504APM

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Texas Instruments

3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

Deep-Dive with AI

Documents3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers datasheet (Rev. B)Understanding Advanced Bus-Interface Products Design Guide +17

Specifications Series Pricing Description Documents

Technical Specifications

Parameters and characteristics for this part

Specification	SN74LVTH182504APM

Logic Type	ABT Scan Test Device With Universal Bus Transceivers
Mounting Type	Surface Mount
Number of Bits	20
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 °C
Package / Case	64-LQFP
Supplier Device Package	64-LQFP (10x10)
Supply Voltage [Max]	3.6 V
Supply Voltage [Min]	2.7 VDC

SN74LVTH182504A Series

3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers

Part	Supply Voltage [Max]	Supply Voltage [Min]	Mounting Type	Logic Type	Package / Case	Operating Temperature [Max]	Operating Temperature [Min]	Number of Bits	Supplier Device Package
Texas Instruments SN74LVTH182504APM	3.6 V	2.7 VDC	Surface Mount	ABT Scan Test Device With Universal Bus Transceivers	64-LQFP	85 °C	-40 °C	20	64-LQFP (10x10)
Texas Instruments 74LVTH182504APMG4	3.6 V	2.7 VDC	Surface Mount	ABT Scan Test Device With Universal Bus Transceivers	64-LQFP	85 °C	-40 °C	20	64-LQFP (10x10)

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

Arrow	N/A	160	$ 3.99
Digikey	Tray	160	$ 6.14
Texas Instruments	JEDEC TRAY (10+1)	1	$ 6.29
		100	$ 5.12
		250	$ 4.03
		1000	$ 3.42

Description

General part information

SN74LVTH182504A Series

The 'LVTH18504A and 'LVTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Additionally, these devices are designed specifically for low-voltage (3.3-V) VCCoperation, but with the capability to provide a TTL interface to a 5-V system environment.

In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers.