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ADC32RF55IRTDT

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Texas Instruments

DUAL-CHANNEL 14-BIT 3-GSPS RF-SAMPLING ADC WITH LOW NOISE SPECTRAL DENSITY (NSD)

VQFNP (RTD)
Integrated Circuits (ICs)

ADC32RF55IRTDT

Active
Texas Instruments

DUAL-CHANNEL 14-BIT 3-GSPS RF-SAMPLING ADC WITH LOW NOISE SPECTRAL DENSITY (NSD)

Technical Specifications

Parameters and characteristics for this part

SpecificationADC32RF55IRTDT
ConfigurationMUX-ADC
Data InterfaceSPI, Serial
Input TypeSingle Ended
Mounting TypeWettable Flank, Surface Mount
Number of A/D Converters4
Number of Bits14
Number of Inputs4
Operating Temperature [Max]85 °C
Operating Temperature [Min]-40 °C
Package / Case64-VFQFN Exposed Pad
Ratio - S/H:ADC0:4
Reference TypeExternal
Sampling Rate (Per Second)3 G
Supplier Device Package64-VQFN (9x9)
Voltage - Supply, Analog [Max]1.225 V, 1.85 V
Voltage - Supply, Analog [Min]1.175 V, 1.75 V
Voltage - Supply, Digital [Max]1.225 V
Voltage - Supply, Digital [Min]1.175 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTape & Reel (TR) 250$ 1942.50
Texas InstrumentsSMALL T&R 1$ 1864.80
100$ 1709.40
250$ 1616.16
1000$ 1554.00

Description

General part information

ADC32RF55 Series

The ADC32RF5x is a single core 14-bit, 2.6 GSPS to 3 GSPS, dual channel analog to digital converters (ADC) that supports RF sampling with input frequencies up to 3 GHz. The design maximizes signal-to-noise ratio (SNR) and delivers a noise spectral density of -155 dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -161 dBFS/Hz.

Each ADC channel can be connected to a quad-band digital down-converter (DDC) using a 48-bit NCO which supports phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1 µs.

The ADC32RF54 and ADC32RF55 supports the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13 Gbps.