
DS1682S+
ActiveREAL TIME CLOCK SERIAL 10BYTE CLOCK/CALENDAR/ALARM/ELAPSED TIME COUNTER 8-PIN SOIC N TUBE
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DS1682S+
ActiveREAL TIME CLOCK SERIAL 10BYTE CLOCK/CALENDAR/ALARM/ELAPSED TIME COUNTER 8-PIN SOIC N TUBE
Technical Specifications
Parameters and characteristics for this part
| Specification | DS1682S+ |
|---|---|
| Current - Timekeeping (Max) [Max] | 15 µA |
| Current - Timekeeping (Max) [Min] | 4 µA |
| Date Format | Binary |
| Features | Alarm, EEPROM |
| Interface | I2C, 2-Wire Serial |
| Memory Size | 80 b |
| Mounting Type | Surface Mount |
| Operating Temperature [Max] | 85 °C |
| Operating Temperature [Min] | -40 C |
| Package / Case | 0.154 in |
| Package / Case | 8-SOIC |
| Package / Case | 3.9 mm |
| Supplier Device Package | 8-SOIC |
| Time Format | Binary |
| Type | Elapsed Time Counter |
| Voltage - Supply [Max] | 5.5 V |
| Voltage - Supply [Min] | 2.5 V |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
Description
General part information
DS1682 Series
The DS1682 is an integrated elapsed-time recorder containing a factory-calibrated, temperature-compensated RC time base that eliminates the need for an external crystal. Using EEPROM technology to maintain data in the absence of power, the DS1682 requires no backup power source. The DS1682 detects and records the number of events on the EVENT pin and the total cumulative event time since the DS1682 was last reset to 0. The active-low ALARM pin alerts the user when the total time accumulated equals the user-programmed alarm value. The polarity of the open-drain active-low ALARM pin can be programmed to either drive low or to become high impedance upon an alarm condition. The DS1682 is ideal for applications that monitor the total amount of time that a device has been in operation and/or the number of uses since inception of service, repair, or the last calibration.ApplicationsAny System Where Time-of-Use is Important (Warranty Tracking)High-Temp, Rugged, Industrial Applications Where Vibration or Shock Could Damage a Quartz Crystal
Documents
Technical documentation and resources