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SN0048HBX

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Texas Instruments

POWER MANAGEMENT IC DEVELOPMENT TOOLS RADIATION-HARDENED QMLV 200-V HALF-BRID

CFP (HBX)
Integrated Circuits (ICs)

SN0048HBX

Active
Texas Instruments

POWER MANAGEMENT IC DEVELOPMENT TOOLS RADIATION-HARDENED QMLV 200-V HALF-BRID

Technical Specifications

Parameters and characteristics for this part

SpecificationSN0048HBX
ApplicationsGeneral Purpose
Current - Output / Channel1.3 A
Current - Peak Output2.5 A
Fault ProtectionShoot-Through
FeaturesBootstrap Circuit
InterfaceLogic, PWM
Load TypeInductive, Capacitive
Mounting TypeSurface Mount
Operating Temperature [Max]125 °C
Operating Temperature [Min]-55 ░C
Output ConfigurationHalf Bridge (2)
Package / Case48-CFlatPack
Supplier Device Package48-CFP
TechnologyNMOS, PMOS
Voltage - Supply [Max]14 V
Voltage - Supply [Min]10 VDC

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyN/A 0$ 578.83
MouserN/A 1$ 465.72
Texas InstrumentsNOT REQUIRED 1$ 441.00
10$ 406.00
100$ 350.00

Description

General part information

TPS7H6003-SP Series

The TPS7H60x3-SP series of radiation-hardness-assured (RHA) gallium nitride (GaN) field effect transistor (FET) gate drivers is designed for high frequency, high efficiency applications. The series consists of the TPS7H6003-SP (200V rating), TPS7H6013-SP (60V rating), and the TPS7H6023-SP (22V rating). The drivers feature adjustable dead time capability, small 30ns propagation delay, and 5.5ns high-side and low-side matching. These parts also include internal high-side and low-side LDOs which ensure a drive voltage of 5V regardless of supply voltage. The TPS7H60x3-SP drivers all have split-gate outputs, providing flexibility to adjust the turn-on and turn-off strength of the outputs independently.

The TPS7H60x3-SP drivers feature two control input modes: independent input mode (IIM) and PWM mode. In IIM each of the outputs is controlled by a dedicated input. In PWM mode, two complementary outputs signals are generated from a single input and the user can adjust the dead time for each edge.

The gate drivers also offer user configurable input interlock in independent input mode as anti-shoot through protection. Input interlock disallows turn-on of both outputs when both inputs are on simultaneously. The user has the option to enable or disable this protection in independent input mode, which allows the driver to be used in a number of different converter configurations. The drivers can also be utilized for both half-bridge and dual-low side converter applications.

Documents

Technical documentation and resources

Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form

Application note

DLA Approved Optimizations for QML Products (Rev. B)

Application brief

TPS7H6003-SP Total Ionizing Dose (TID) Radiation Report

Radiation & reliability report

Single-Event Effects Confidence Interval Calculations (Rev. A)

Application note

TPS7H60X3-SP Neutron Displacement Damage (NDD) Characterization Report (Rev. A)

Radiation & reliability report

TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. B)

More literature

QML flow, its importance, and obtaining lot information (Rev. C)

Application note

DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer

Application note

TPS7H60x3-SP Radiation-Hardness-Assured 1.3A, 2.5A, Half Bridge GaN FET Gate Drivers datasheet (Rev. C)

Data sheet

TPS7H6003EVM-CVAL EU Declaration of Conformity (DoC)

Certificate

Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A)

Application note

TI Space Products (Rev. K)

Selection guide

TPS7H6003-SP Single-Event Effects (SEE) Report (Rev. A)

Radiation & reliability report

How can you optimize SWaP for next-generation satellites with electrical power systems (Rev. A)

Technical article

TPS7H60x3EVM-CVAL and TPS7H60x5EVM Evaluation Module User's Guide (Rev. B)

EVM User's guide

Radiation-Hardened Space Battery Management System (BMS) Reference Design

Design guide

如何為具有電子電源系統的下一代衛星最佳化 SWaP (Rev. A)

Technical article

전력 시스템으로 차세대 위성의 SWaP를 최적화하는 방법 (Rev. A)

Technical article

SN0048HBX | Datasheet

Datasheet