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LTC2192CUKG#TRPBF
Integrated Circuits (ICs)

LTC2192CUKG#TRPBF

Active
Analog Devices Inc./Maxim Integrated

16-BIT, 65MSPS LOW POWER DUAL ADCS

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Search across all available documentation for this part.

DocumentsPackage Drawing - 52-Lead QFN (7mm x 8mm x 0.75mm w/ EP)R538 Reliability Data+1
LTC2192CUKG#TRPBF
Integrated Circuits (ICs)

LTC2192CUKG#TRPBF

Active
Analog Devices Inc./Maxim Integrated

16-BIT, 65MSPS LOW POWER DUAL ADCS

Deep-Dive with AI

DocumentsPackage Drawing - 52-Lead QFN (7mm x 8mm x 0.75mm w/ EP)R538 Reliability Data+1

Technical Specifications

Parameters and characteristics for this part

SpecificationLTC2192CUKG#TRPBF
ArchitecturePipelined
ConfigurationS/H-ADC
Data InterfaceLVDS - Serial
FeaturesSimultaneous Sampling
Input TypeDifferential
Mounting TypeSurface Mount
Number of A/D Converters2
Number of Bits16
Number of Inputs2
Operating Temperature [Max]70 °C
Operating Temperature [Min]0 °C
Package / Case52-WFQFN Exposed Pad
Ratio - S/H:ADC1:1
Reference TypeInternal, External
Sampling Rate (Per Second)65 M
Supplier Device Package52-QFN (7x8)
Voltage - Supply, Analog [Max]1.9 V
Voltage - Supply, Analog [Min]1.7 V
Voltage - Supply, Digital [Max] [custom]1.9 V
Voltage - Supply, Digital [Min] [custom]1.7 V

LTC2192 Series

16-Bit, 65Msps Low Power Dual ADCs

PartVoltage - Supply, Analog [Max]Voltage - Supply, Analog [Min]Number of InputsMounting TypeArchitectureVoltage - Supply, Digital [Max] [custom]Voltage - Supply, Digital [Min] [custom]Input TypeData InterfaceNumber of BitsSupplier Device PackageSampling Rate (Per Second)Reference TypeRatio - S/H:ADCNumber of A/D ConvertersFeaturesConfigurationOperating Temperature [Max]Operating Temperature [Min]Package / Case
52 QFN EP
Analog Devices Inc./Maxim Integrated
LTC2192IUKG#TRPBF
1.9 V
1.7 V
2
Surface Mount
Pipelined
1.9 V
1.7 V
Differential
LVDS - Serial
16
52-QFN (7x8)
65 M
External
Internal
1:1
2
Simultaneous Sampling
S/H-ADC
85 °C
-40 C
52-WFQFN Exposed Pad
LTC2192IUKG#PBF
Analog Devices Inc./Maxim Integrated
LTC2192IUKG#PBF
1.9 V
1.7 V
2
Surface Mount
Pipelined
1.9 V
1.7 V
Differential
LVDS - Serial
16
52-QFN (7x8)
65 M
External
Internal
1:1
2
Simultaneous Sampling
S/H-ADC
85 °C
-40 C
52-WFQFN Exposed Pad
LTC2192CUKG#TRPBF
Analog Devices Inc./Maxim Integrated
LTC2192CUKG#TRPBF
1.9 V
1.7 V
2
Surface Mount
Pipelined
1.9 V
1.7 V
Differential
LVDS - Serial
16
52-QFN (7x8)
65 M
External
Internal
1:1
2
Simultaneous Sampling
S/H-ADC
70 °C
0 °C
52-WFQFN Exposed Pad
LTC2192CUKG#PBF
Analog Devices Inc./Maxim Integrated
LTC2192CUKG#PBF
1.9 V
1.7 V
2
Surface Mount
Pipelined
1.9 V
1.7 V
Differential
LVDS - Serial
16
52-QFN (7x8)
65 M
External
Internal
1:1
2
Simultaneous Sampling
S/H-ADC
70 °C
0 °C
52-WFQFN Exposed Pad

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$Updated
DigikeyN/A 0$ 104.671m+

Description

General part information

LTC2192 Series

The LTC2192/LTC2191/LTC2190 are 2-channel, simultaneous sampling 16-bit A/D converters designed for digitizing high frequency, wide dynamic range signals. They are perfect for demanding communications applications with AC performance that includes 77dB SNR and 90dB spurious free dynamic range (SFDR). Ultralow jitter of 0.07psRMSallows undersampling of IF frequencies with excellent noise performance.DC specs include ±2LSB INL (typ), ±0.5LSB DNL (typ) and no missing codes over temperature. The transition noise is 3.3LSBRMS.To minimize the number of data lines the digital outputs are serial LVDS. Each channel outputs one bit, two bits or four bits at a time. The LVDS drivers have optional internal termination and adjustable output levels to ensure clean signal integrity.The ENC+and ENC–inputs may be driven differentially or single ended with a sine wave, PECL, LVDS, TTL or CMOS inputs. An internal clock duty cycle stabilizer allows high performance at full speed for a wide range of clock duty cycles.ApplicationsCommunicationsCellular Base StationsSoftware-Defined RadiosPortable Medical ImagingMulti-Channel Data AcquisitionNondestructive Testing