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Technical Specifications
Parameters and characteristics for this part
| Specification | ADS1115EVM |
|---|---|
| Data Interface | Serial, I2C |
| Number of A/D Converters | 1 |
| Number of Bits | 16 |
| Power (Typ) @ Conditions | 150 mW |
| Sampling Rate (Per Second) | 860 Per Second |
| Supplied Contents | Board(s) |
| Utilized IC / Part | ADS1115 |
Pricing
Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly
| Distributor | Package | Quantity | $ | |
|---|---|---|---|---|
Description
General part information
ADS1115-Q1 Series
The ADS1113-Q1, ADS1114-Q1, and ADS1115-Q1 devices ( ADS111x-Q1) are precision, low-power, 16-bit, I2C-compatible, analog-to-digital converters (ADCs) offered in VSSOP-10 and UQFN-10 packages. The ADS111x-Q1 devices incorporate a low-drift voltage reference and an oscillator. The ADS1114-Q1 and ADS1115-Q1 also incorporate a programmable gain amplifier (PGA) and a digital comparator. These features, along with a wide operating supply range, make the ADS111x-Q1 well suited for power- and space-constrained, sensor measurement applications.
The ADS111x-Q1 perform conversions at data rates up to 860 samples per second (SPS). The PGA offers input ranges from ±256 mV to ±6.144 V, allowing precise large- and small-signal measurements. The ADS1115-Q1 features an input multiplexer (MUX) that allows two differential or four single-ended input measurements. Use the digital comparator in the ADS1114-Q1 and ADS1115-Q1 for under- and overvoltage detection.
The ADS1113-Q1, ADS1114-Q1, and ADS1115-Q1 devices ( ADS111x-Q1) are precision, low-power, 16-bit, I2C-compatible, analog-to-digital converters (ADCs) offered in VSSOP-10 and UQFN-10 packages. The ADS111x-Q1 devices incorporate a low-drift voltage reference and an oscillator. The ADS1114-Q1 and ADS1115-Q1 also incorporate a programmable gain amplifier (PGA) and a digital comparator. These features, along with a wide operating supply range, make the ADS111x-Q1 well suited for power- and space-constrained, sensor measurement applications.
Documents
Technical documentation and resources
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