Specification	V62/04730-01XE

Logic Type	ABT Scan Test Device With Universal Bus Transceivers
Mounting Type	Surface Mount
Number of Bits	9
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 °C
Package / Case	6.1 mm
Package / Case	64-TFSOP
Package / Case [x]	0.24 in
Supplier Device Package	64-TSSOP
Supply Voltage [Max]	3.6 V
Supply Voltage [Min]	2.7 VDC

SN74LVTH182512-EP Series

Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers

Part	Supply Voltage [Max]	Supply Voltage [Min]	Operating Temperature [Max]	Operating Temperature [Min]	Logic Type	Supplier Device Package	Number of Bits	Package / Case [x]	Package / Case	Package / Case	Mounting Type
Texas Instruments V62/04730-01XE	3.6 V	2.7 VDC	85 °C	-40 °C	ABT Scan Test Device With Universal Bus Transceivers	64-TSSOP	9	0.24 in	6.1 mm	64-TFSOP	Surface Mount
Texas Instruments 8V182512IDGGREP	3.6 V	2.7 VDC	85 °C	-40 °C	ABT Scan Test Device With Universal Bus Transceivers	64-TSSOP		0.24 in	6.1 mm	64-TFSOP	Surface Mount

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

Digikey	Tape & Reel (TR)	2000	$ 10.10
Texas Instruments	LARGE T&R	1	$ 13.42
		100	$ 11.72
		250	$ 9.04
		1000	$ 8.08

Description

General part information

SN74LVTH182512-EP Series

The SN74LVTH18512 and SN74LVTH182512 scan test devices with 18-bit universal bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Additionally, these devices are designed specifically for low-voltage (3.3-V) VCCoperation, but with the capability to provide a TTL interface to a 5-V system environment.

In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE™ universal bus transceivers.