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Littelfuse Power Semi ISOPLUSi4PAC 3 2Sq 3L image
Discrete Semiconductor Products

IXYF40N450

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Littelfuse/Commercial Vehicle Products

DISC IGBT XPT-HI VOLTAGE I4-PAK ISO+/ TUBE

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Littelfuse Power Semi ISOPLUSi4PAC 3 2Sq 3L image
Discrete Semiconductor Products

IXYF40N450

Active
Littelfuse/Commercial Vehicle Products

DISC IGBT XPT-HI VOLTAGE I4-PAK ISO+/ TUBE

Deep-Dive with AI

DocumentsDatasheet

Technical Specifications

Parameters and characteristics for this part

SpecificationIXYF40N450
Current - Collector (Ic) (Max) [Max]60 A
Current - Collector Pulsed (Icm)350 A
Gate Charge170 nC
Mounting TypeThrough Hole
Operating Temperature [Max]150 °C
Operating Temperature [Min]-55 °C
Package / Casei4-Pac™-4, Isolated
Power - Max [Max]290 W
Supplier Device PackageISOPLUS i4-PAC™
Td (on/off) @ 25°C110 ns, 36 ns
Test Condition40 A, 15 V, 2 Ohm, 960 V
Vce(on) (Max) @ Vge, Ic3.9 V
Voltage - Collector Emitter Breakdown (Max)4500 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyTube 300$ 109.31
NewarkEach 100$ 112.32

Description

General part information

IXYF40N450 Series

Designed using the proprietary thin-wafer XPT™ technology and state-of-the-art IGBT process, these devices display qualities such as reduced thermal resistance, low tail current, low energy loss, and high-speed switching capability. Thanks to the positive temperature coefficient of their on-state voltage, these high-voltage IGBTs can be used in parallel, which provides cost-effective solutions compared to series-connected, lower-voltage devices. Consequently, this results in reduction in the associated gate drive circuitry, simplicity in design, and improvement in the reliability of the overall system. The optional co-packed fast recovery diodes have low reverse recovery time and are optimized to produce smooth switching waveforms and significantly lower electromagnetic interference (EMI). Advantages: Higher efficiency Elimination of multiple series-connected devices Increased reliability of power systems

Documents

Technical documentation and resources